2000
DOI: 10.1016/s0039-6028(99)01061-4
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Chemical interaction of NF3 ion beams and plasmas with Si (Part I): X-ray photoelectron spectroscopy studies

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Cited by 17 publications
(8 citation statements)
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“…The atomic fractions of N and F are stated in Figure , showing that the N fraction of all samples was significantly less than the 25% expected if all NF 3 atoms remained on the surface. An F 1s spectrum measured with lower pass energy (not shown) yields that the peak maximum is located at 687.2 eV, as expected for a mixture of F–Si and F bound to a more electronegative element like N. , We note that our data agree with a previous study that showed that chemisorption of NF 3 onto Si(100) results in the formation of Si–F and Si–N bonds with substoichiometric N . The escape of nitrogen atoms is possible in the form of NF x and N 2 gas.…”
Section: Resultssupporting
confidence: 90%
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“…The atomic fractions of N and F are stated in Figure , showing that the N fraction of all samples was significantly less than the 25% expected if all NF 3 atoms remained on the surface. An F 1s spectrum measured with lower pass energy (not shown) yields that the peak maximum is located at 687.2 eV, as expected for a mixture of F–Si and F bound to a more electronegative element like N. , We note that our data agree with a previous study that showed that chemisorption of NF 3 onto Si(100) results in the formation of Si–F and Si–N bonds with substoichiometric N . The escape of nitrogen atoms is possible in the form of NF x and N 2 gas.…”
Section: Resultssupporting
confidence: 90%
“…The RPS-induced Si 2p spectral intensity thus likely stems from fluorinated and oxidized Si atoms. Possibly, a part of the surface exhibits Si-O-F groups as has been proposed for NF3 exposure in the presence of residual oxygen 33,36 .…”
Section: Nf3 Treatment Of H-si(100)mentioning
confidence: 92%
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“…Si-F species typically yield F(1s) binding energies of 685.6-686.4 eV. [10][11][12][13][14] Therefore, we attribute the 686.5 eV peak to Si-F species formed by dissociative adsorption of BF 3 . The dissociation of BF 3 would be expected to produce species such as Si-BF 2 and (Si) 2 -BF.…”
mentioning
confidence: 99%
“…The interest in this chemistry, that started essentially for fundamental reasons [11,12], has become progressively related to the above-mentioned industrial use of NF 3 . In fact, during the etching and cleaning processes, the dissociation of pure or diluted (for example, with helium, argon, or oxygen) NF 3 generates the chemically active fluorine atoms as well as ionic species such as NF x + (x = 1-3), N 2 F + , and NO x + (x = 1, 2) [25] whose active role is substantiated by experimental [26][27][28] and theoretical evidence [29,30]. A detailed knowledge of the ion chemistry of NF 3 /O 2 and NF 3 /N 2 gaseous mixtures is also of interest for the proposed use of O 2 -and N 2 -based plasmas [31,32] to reduce the atmospheric emissions of NF 3 .…”
Section: Introductionmentioning
confidence: 99%