“…The physical and chemical properties of materials depend mainly on the elements, composition ratios, and spatial distribution in samples. The scanning X-ray fluorescence microscope is a powerful tool for fine elemental mapping, and many biomedical [1], material [2], plant [3], fossil [4], art [5], and industrial samples [6] have been observed. However, to use scanning X-ray fluorescence microscopes, highly brilliant X-rays such as synchrotron radiation (SR) at third-generation synchrotron facilities is required, and a long measurement period is required to perform fine observations at small synchrotron facilities such as the SAGA Light Source in Tosu, Japan.…”