2002
DOI: 10.1017/s1431927602020159
|View full text |Cite
|
Sign up to set email alerts
|

Chemical Microcharacterization of Ultrathin Iodide Conversion Layers and Adsorbed Thiocyanate Surface Layers on Silver Halide Microcrystals with Time-of-Flight SIMS

Abstract: The technique of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) and dual beam depth profiling has been used to study the composition of the surface of tabular silver halide microcrystals. Analysis of individual microcrystals with a size well below 1 μm from a given emulsion is possible. The method is successfully applied for the characterization of silver halide microcrystals with subpercent global iodide concentrations confined in surface layers with a thickness below 5 nm. The deve… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2003
2003
2003
2003

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 10 publications
0
0
0
Order By: Relevance