2013
DOI: 10.1134/s1070427213050157
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Chemical surface deposition and growth rate of thin CdSe films

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Cited by 13 publications
(6 citation statements)
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“…Within the method used, the electronic wave functions were expanded in a plane wave basis set with the energy cut-off of 310 eV. The electrons 4d 10 5s 2 for Cd, 5s 2 5p 4 for Te and 4s 2 4p 4 for Se atoms were taken as the valence ones. For DFT calculations of Cd 16 Se 15 Te solid state solution, the 2×1×2 supercell containing 32 atoms was created.…”
Section: Methods Of Calculationmentioning
confidence: 99%
See 1 more Smart Citation
“…Within the method used, the electronic wave functions were expanded in a plane wave basis set with the energy cut-off of 310 eV. The electrons 4d 10 5s 2 for Cd, 5s 2 5p 4 for Te and 4s 2 4p 4 for Se atoms were taken as the valence ones. For DFT calculations of Cd 16 Se 15 Te solid state solution, the 2×1×2 supercell containing 32 atoms was created.…”
Section: Methods Of Calculationmentioning
confidence: 99%
“…The A II B VI semiconductor compounds and their solid solutions, such as CdSeTe, have important applications such as infrared detectors, solar cells and other devices [1][2][3][4][5][6][7][8][9][10]. Despite the recent intensive experimental and theoretical studies of these materials some of the fundamental parameters are currently unknown, primarily mechanical properties.…”
Section: Introductionmentioning
confidence: 99%
“…The height or peak area of the element which was fixed on the voltamperohrama is proportional to its mass part in the solution. The film thickness was calculated without taking into account the roughness, using the mass part of the element, the area of the substrate and tabular data density of CdS and CdSe, in accordance with the technique [9].…”
Section: Methodsmentioning
confidence: 99%
“…From to the values obtained for the mass concentration of cadmium, the area of the substrate and tabulated data for the density of CdS and CdSe, the thickness of the films was calculated, without taking into account roughness, by the method of [8].…”
Section: Methodsmentioning
confidence: 99%