“…In fact, when 20 nm-thick Sr-doped NTO films with upward and downward Sr composition gradients were similarly fabricated on 80 nm-thick NTO films, respectively, such a strong segregation nature of Sr atoms led to a completely inverted composition gradient of Sr in the film that had been designed to have the downward Sr composition gradient (Supporting Information, Figure S9). The diffusive nature of Sr ions has been reported in many oxide film systems such as (LaSr)CoO 3 , and (SrCa)MnO 3 , in contrast to the case of compositionally graded Ba 1‑x Sr x TiO 3 films with almost no Sr diffusion, including our previous result as well as those reported by other research groups. ,, It is known that the diffusion of atoms/ions in a crystal can be enhanced through even very small lattice defects and grain boundaries in the crystal, and this diffusion mechanism holds true for Sr ions. A similar lattice defect-enhanced diffusivity of O 2– ions from an oxide substrate was reported in SrTiO 3 films during vapor deposition such as PLD. , In the present case, the volatile nature of Na is likely to cause a large amount of A-site defects in Sr–NTO films, as already discussed above to explain the charging effects in the XPS measurement, probably enhancing the diffusivity of Sr ions in Sr–NTO films.…”