Chemischer Informationsdienst
 1986
DOI: 10.1002/chin.198603023
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ChemInform Abstract: Ellipsometry of the Growth and Dissolution of Anodic Oxide Films on Aluminum in Alkaline Solution.

R. Greef1,
Chuck Norman2

Abstract: Die ellipsometrische Untersuchung des Oxid?lmwachstums auf hochreinem Al in 0.1 ‐4 M NaOH erfolgt in situ bei einer konstanten Wellenlänge von 632.8 nm.

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