ChemInform Abstract: Growth and Characterization of Eu:Y₂O₃ Thin‐Film Phosphors on Silicon and Diamond‐Coated Silicon Substrates.

Abstract

Growth and Characterization of Eu:Y 2 O 3 Thin-Film Phosphors on Silicon and Diamond-Coated Silicon Substrates.-High quality phosphor films are deposited by use of the pulsed laser deposition technique. The highest brightness obtained for as-deposited Eu:Y 2 O 3 films grown on diamond-coated Si substrates at 700 • C is comparable to the brightness of Eu:Y 2 O 3 powder. This can be attributed to reduced internal reflection, low photon energy absorption by substrate, and enhanced scattering of incident beam with lattice. -(CHO, K. G.; KUMAR, D.; JONES, S. L.; LEE, D. G.; HOLLOWAY, P. H.; SINGH, R. K.; J. Electrochem. Soc. 145 (1998) 10, 3456-3462; Dep. Mater. Sci. Eng., Univ. Fla.,