Chemischer Informationsdienst
 1975
DOI: 10.1002/chin.197506014
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ChemInform Abstract: OPTICAL INVESTIGATION OF DIFFERENT SILICON FILMS

Ch. Kuehl1,
H. Schloetterer2,
F. Schwidefsky3

Abstract: Im Falle schwacher Absorption kann das spektrale Reflexionsvermögen eines dünnen Films auf einem nichtabsorbierenden Substrat zur Bestimmung der spektralen Abhängigkeit der Absorptionskonstanten benutzt werden.

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