1994
DOI: 10.1002/chin.199452288
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ChemInform Abstract: Pulsed Laser Deposition of Ferrite Thin Films

Abstract: ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable via the “References” option.

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Cited by 33 publications
(51 citation statements)
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“…Although thin film processes by sputtering and laser ablation are carried out in relatively high vacuum, generation of charged or neutral clusters as well as charged and neutral atoms is well established. [66][67][68] In these high vacuum processes, clusters are not formed in the gas phase, but are emitted from the target. In the thermal evaporation process, the base pressure is normally less than 10 26 torr, although the pressure increases to 10 23 -10 24 torr during the evaporation process.…”
Section: Effect Of Bias On Deposition Behaviourmentioning
confidence: 99%
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“…Although thin film processes by sputtering and laser ablation are carried out in relatively high vacuum, generation of charged or neutral clusters as well as charged and neutral atoms is well established. [66][67][68] In these high vacuum processes, clusters are not formed in the gas phase, but are emitted from the target. In the thermal evaporation process, the base pressure is normally less than 10 26 torr, although the pressure increases to 10 23 -10 24 torr during the evaporation process.…”
Section: Effect Of Bias On Deposition Behaviourmentioning
confidence: 99%
“…In the case of sputtering 66,67 and laser ablation, 68 emission of neutral or charged clusters from the target is well established. If the reactor is in high vacuum with long mean free path, further collisions between clusters will not be appreciable and most neutral clusters remain In this sense, a moderate vacuum is beneficial to promote charging of the clusters, which is beneficial again in producing void-free films.…”
Section: Mechanism Of Cluster Charging In the Thin Film Processmentioning
confidence: 99%
“…The PLD technique is a non-equilibrium process 3 because the surface temperature of the target is ,10 5 K, electric field is ,10 5 V cm 21 and the energy of the ablated species is ,1-100 eV. In addition, the technique primarily involves quenching of matter from the vapor state.…”
Section: Non-equilibrium Processmentioning
confidence: 99%
“…Attempts have been made for a large area deposition of ,200 mm diameter by PLD. 3,13 The technique is fast emerging from a small scale research based laboratory technique to an important industrial technology. However, there are several challenges that have to be overcome before wide ranging industrial adoption of the technique.…”
Section: Challenges In Pldmentioning
confidence: 99%
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