“…The eight methods used in this work are Chi-Square (CS), Correlation (Cor), Information Gain (IG), Symmetrical Uncertainty (SU), Fisher Score (FS), Welch T-Statistic (WTS), ReliefF (RF), One Rule (OneR). The reason why we choose these methods is that they are widely used in defect prediction and belong to different feature selection families [28], [30]. CS is a statistic-based method, Cor is a correlation-based method, IG and SU are entropy-based methods, FS and WTS are first order statistics-based methods, RF is a instance-based, OneR is a classifier-based method.…”