ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) 2021
DOI: 10.1109/esscirc53450.2021.9567890
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Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies

Sylvain Clerc
1
,
Kedar Janardan Dhori
2
,
Robin Wilson
3
et al.
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