2012
DOI: 10.1134/s1063785012050197
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Classification of the amorphous film crystallization types with respect to structure and morphology features

Abstract: Based on the results of electron microscopic investigations and analysis of the published data, a classification of the types of crystallization of amorphous films with respect to their structure and morphology features is proposed. According to this, the layer, island, and dendrite polymorphous crystallization types, as well as the fluid phase crystallization that proceeds with the phase separation of a medium, are distinguished.

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Cited by 19 publications
(2 citation statements)
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“…This is convenient because the crystallization and investigation of its results are carried out in a vacuum column of an electron microscope without extracting the sample into the air. For example, using electron beam crystallization, structural transformations were studied in a variety of amorphous stoichiometric oxides: ZrO 2 [1], Cr 2 O 3 [2], ReO 3 [2], Al 2 O 3 [3], Fe 2 O 3 [4], Ni 2 O 3 [5], HfO 2 [2,6]. However, there are no reports on electron-stimulated crystallization of amorphous non-stoichiometric oxides.…”
Section: Introductionmentioning
confidence: 99%
“…This is convenient because the crystallization and investigation of its results are carried out in a vacuum column of an electron microscope without extracting the sample into the air. For example, using electron beam crystallization, structural transformations were studied in a variety of amorphous stoichiometric oxides: ZrO 2 [1], Cr 2 O 3 [2], ReO 3 [2], Al 2 O 3 [3], Fe 2 O 3 [4], Ni 2 O 3 [5], HfO 2 [2,6]. However, there are no reports on electron-stimulated crystallization of amorphous non-stoichiometric oxides.…”
Section: Introductionmentioning
confidence: 99%
“…Numerous 'in situ' electron microscopy studies have proved that polymorphic crystallization of thin amorphous films can be adequately described by phenomenological scheme that includes the following types (modes) of crystal growth in the amorphous matrix [3][4][5].…”
Section: Introductionmentioning
confidence: 99%