2011
DOI: 10.1017/s1431927611000420
|View full text |Cite
|
Sign up to set email alerts
|

Closed-Cell Foam Skin Thickness Measurement Using a Scanning Electron Microscope

Abstract: Closed cell polymer foam skin thickness can be assessed by taking backscatter electron (BSE) images in a scanning electron microscope (SEM) at a series of accelerating voltages. Under a given set of experimental conditions, the electron beam mostly passes through thin polymer skin cell walls. That cell appears dark compared to adjacent thicker-skinned cells. Higher accelerating voltages lead to a thicker skin being penetrated. Monte Carlo modeling of beam-sample interactions indicates that at 5 keV, skin less … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
4
0

Year Published

2015
2015
2023
2023

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(4 citation statements)
references
References 7 publications
0
4
0
Order By: Relevance
“…Monte Carlo simulation for electron microscope analysis has been reported in many publications. , It is a useful tool for researchers and operators to understand beam–sample interactions in order to choose favorable experimental conditions for lab experiment design. Figure a shows the simulation result of different accelerating voltage beams interacting with nickel.…”
Section: Resultsmentioning
confidence: 99%
“…Monte Carlo simulation for electron microscope analysis has been reported in many publications. , It is a useful tool for researchers and operators to understand beam–sample interactions in order to choose favorable experimental conditions for lab experiment design. Figure a shows the simulation result of different accelerating voltage beams interacting with nickel.…”
Section: Resultsmentioning
confidence: 99%
“…BSEs have a distribution of energies and the sensitivity of BSE detectors is a complex function of electron energy (Radzimski & Russ, 1995). However, work by Todd & Kuznetsova (2011) showed that the backscatter coefficient is an acceptable proxy for the signal from typical solid-state BSE detectors in SEMs.
Figure 6 Modeled backscattered electron coefficient as a function of latex layer thickness and accelerating voltage.
…”
Section: Resultsmentioning
confidence: 99%
“…Although many authors have used characteristic X-ray attenuation to quantitatively measure coating thicknesses (i.e., Pouchou & Pichoir, 1990; Pouchou, 1993), there are few literature examples exploiting BSE images collected at a range of accelerating voltages to quantitatively characterize layer thickness information in this manner (Todd & Kuznetsova, 2011). Regardless of the quantitative calibration of image brightness to exact latex thickness, qualitative comparison of latex coverage by characterizing bright/dark distribution in BSE images within one sample or between different samples is robust and easy to apply.…”
Section: Resultsmentioning
confidence: 99%
“…The number of pores depends on the type of spongy material. There are low, medium and high porosity materials (Liu et al, 2014;Todd and Kuznetsova, 2011). It is assumed that the first two types have a closed pore structure resembling dense crisscrossed connections.…”
Section: Introductionmentioning
confidence: 99%