2017
DOI: 10.1088/2053-1591/aa9afb
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Closed-form solution for static pull-in voltage of electrostatically actuated clamped–clamped micro/nano beams under the effect of fringing field and van der Waals force

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Cited by 4 publications
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“…In nanoscale, electrostatic actuators suffer from surface forces, such as van der Waal and electrostatic forces [77][78][79]. An electrostatically actuated clamp-clamp micro/nano beam static pull-in voltage closed-loop solution under the action of fringe fields and van der Waals forces was presented in [80]. The stress instability of double-pressed nanocon ductors evaluating electrostatic and intermolecular forces was investigated in [78].…”
Section: Mathematical Modeling and Main Issuesmentioning
confidence: 99%
“…In nanoscale, electrostatic actuators suffer from surface forces, such as van der Waal and electrostatic forces [77][78][79]. An electrostatically actuated clamp-clamp micro/nano beam static pull-in voltage closed-loop solution under the action of fringe fields and van der Waals forces was presented in [80]. The stress instability of double-pressed nanocon ductors evaluating electrostatic and intermolecular forces was investigated in [78].…”
Section: Mathematical Modeling and Main Issuesmentioning
confidence: 99%