2022
DOI: 10.1002/pip.3635
|View full text |Cite
|
Sign up to set email alerts
|

Closing the gap between n‐ and p‐type silicon heterojunction solar cells: 24.47% efficiency on lightly doped Ga wafers

Abstract: Silicon heterojunction (SHJ) solar cells can be formed using n‐type or p‐type silicon wafers. To foster the increasing industrial interest of SHJ, cheaper p‐type wafers with a good availability might be preferred, but until today, they yield lower cell efficiency compared with n‐type and show instabilities in the particular case of boron doping. This work shows that the production flow of high performance rear‐junction bifacial n‐type cells can be applied to front‐junction p‐type cells without process alterati… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 22 publications
(45 reference statements)
0
1
0
Order By: Relevance
“…While LEO orbits are rather proton rich, we choose electrons beams as a first step here, for there high penetration depth creating uniform defects throughout the various Si thicknesses considered here. Amorphous/Crystalline Si heterojunction solar cells were manufactured on the industrial pilot line of CEA [11], with state-of-the-art gallium-doped Si wafers. Exsitu Begin-Of-Life (BOL) and End-Of-Life (EOL) current voltage and external quantum efficiency characterizations were used to quantify the degradation linked to electrons irradiation.…”
Section: Introductionmentioning
confidence: 99%
“…While LEO orbits are rather proton rich, we choose electrons beams as a first step here, for there high penetration depth creating uniform defects throughout the various Si thicknesses considered here. Amorphous/Crystalline Si heterojunction solar cells were manufactured on the industrial pilot line of CEA [11], with state-of-the-art gallium-doped Si wafers. Exsitu Begin-Of-Life (BOL) and End-Of-Life (EOL) current voltage and external quantum efficiency characterizations were used to quantify the degradation linked to electrons irradiation.…”
Section: Introductionmentioning
confidence: 99%