CMOS Implementation of Time Delay Integration (TDI) for Imaging Applications: A Brief Review

Semwal, Sushil Kumar; Saxena, Raghvendra Sahai

doi:10.1080/02564602.2019.1677516

Cited by 7 publications

(3 citation statements)

References 35 publications

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“…For a detector with M rows of pixels, the charge generated in rows M, M+1 and M+2 etc. are shifted (time-delay) and summed (integration) by applying a potential across each row and the summed signal represents the final output [15]. However, in this work, the principles of TDI were applied to an in-house algorithm for post-processing image reconstruction.…”

Section: Jinst 17 P05010mentioning

confidence: 99%

Contaminant detection using a CZT photon counting detector with TDI image reconstruction

Nguyen¹,

Richtsmeier²,

Iniewski³

et al. 2022

J. Inst.

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Food x-ray inspection systems are designed to detect unwanted physical contaminants in packaged food to maintain a high level of food safety for consumers. Modern day x-ray inspection systems often utilize line scan sensors to detect these physical contaminants but are limited to single or dual energies. However, by using a photon counting detector (PCD), a new generation of food inspection systems capable of acquiring images at more than two energy bins could improve discrimination between low density contaminants. In this work, five type of contaminants were embedded in an acrylic phantom and imaged using a cadmium zinc telluride (CZT) PCD with a pixel pitch of 330 μm. A set of images were acquired while the phantom was stationary, and another set of images were acquired while the phantom was moving to mimic the movement of a conveyor belt. Image quality was assessed by evaluating the contrast-to-noise ratio (CNR) for each set of images. For imaging times larger than 25 ms, the results showed that the moving phantom data set yielded larger CNR values compared to a stationary phantom. While conventional x-ray inspections often utilize line scan sensors, we report that physical contaminant detection is possible with a CZT PCD x-ray imaging system.

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Section: Jinst 17 P05010mentioning

confidence: 99%

Contaminant detection using a CZT photon counting detector with TDI image reconstruction

Nguyen¹,

Richtsmeier²,

Iniewski³

et al. 2022

J. Inst.

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show abstract

“…It has higher sensitivity than the general linear CCD and takes imaging in low-light environments, whatever the scanning speed. TDI-CCD outperformance obtains high sensitivity without sacrificing spatial resolution, making it have a wide range of application prospects in high-speed and low-light fields [ 19 , 20 ].…”

Section: Principles Of the Automatic Optical Inspection For Tftmentioning

confidence: 99%

Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors

Tzu

2021

Micromachines

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The paper presents a typology of electrical open and short defects on thin-film transistors (TFT) using an electrical tester and automatic optical inspection (AOI). The experiment takes the glass 8.5th generation to detect the electrical characteristics engaged with time delay and integration (TDI) charged-coupled-devices (CCDs), a fast line-scan, and a review CCD with five sets of magnification lenses for further inspection. An automatic data acquisition program (ADAP) controls the open/short (O/S) sensor, TDI-CCD, and motor device for machine vision and statistics of substrate defects simultaneously. Furthermore, the quartz mask installed on AOI verified its optical resolution; a TDI-CCD can grab an image of a moving object during transfers of the charge in synchronous scanning with the object that is significant.

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“…T RADITIONAL push-broom spaceborne cameras typically employ TDI charge-coupled device (CCD) detectors for imaging. The peripheral circuitry of these detectors is complex, bulky, and consumes a relatively high amount of power [1]. With the recent advancements in detector manufacturing technology, CMOS detectors have also achieved TDI functionality in the charge domain, analog domain, and digital domain.…”

Section: Introductionmentioning

confidence: 99%

Research on Modeling the Nonlinear Response Function of TDI CMOS Imaging System

Gao,

Zheng,

et al. 2024

IEEE J. Sel. Top. Appl. Earth Observations Remote Sensing

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The camera response function (CRF) establishes a numerical mapping between focal plane radiance, camera imaging parameters, and the intensity of output images. It plays a significant role in areas such as high dynamic range imaging and image processing. To establish an accurate response model for time delay integration (TDI) complementary metal-oxidesemiconductor (CMOS) imaging systems, this paper proposes a radiometric calibration method for TDI CMOS imaging systems based on complex real-world scene images. The study begins by conducting an extensive analysis of the data link within the TDI CMOS imaging system, which serves as the foundation for establishing its a priori theoretical response model. Subsequently, the problem of solving the CRF model is transformed into an overdetermined equation established through the least square method. The optimal solution for this equation is obtained by singular value decomposition (SVD), which leads to the derivation of a three-dimensional response function for the imaging system. Finally, under consistent optical radiation conditions, radiation calibration experiments are performed on various targets using a self-developed TDI CMOS imaging system. The CRF is obtained based on the captured experimental image data. Furthermore, this paper's approach is compared with the widely adopted linear fitting method commonly used within the respective field. The experimental results show that the visually perceived quality, structural similarity, mean grayscale, mean gradient, entropy, and standard deviation of images synthesized using the CRF proposed in this paper are closer to those of actual captured images. The proposed method demonstrates higher accuracy and can provide a reliable basis for applications such as radiation response calibration of on-orbit spaceborne payloads, selection of imaging parameters, and multi-exposure fusion of remote sensing images.

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CMOS Implementation of Time Delay Integration (TDI) for Imaging Applications: A Brief Review

Cited by 7 publications

References 35 publications

Contaminant detection using a CZT photon counting detector with TDI image reconstruction

Contaminant detection using a CZT photon counting detector with TDI image reconstruction

Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors

Research on Modeling the Nonlinear Response Function of TDI CMOS Imaging System

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