2010
DOI: 10.1016/j.surfcoat.2010.09.021
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Co-development of stress and texture in reactive magnetron sputtered TiN films revealed by in situ film stress measurements

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Cited by 5 publications
(2 citation statements)
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“…Similarly high compressive stress values have been also previously reported in case of thinner films deposited by reactive route [42][43], which are observed to decrease with the thickness. This behavior has been reproduced here, with the deposition of an unbiased film on top of a biased one (sample Tb is the underlayer used in sample T).…”
Section: /19supporting
confidence: 85%
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“…Similarly high compressive stress values have been also previously reported in case of thinner films deposited by reactive route [42][43], which are observed to decrease with the thickness. This behavior has been reproduced here, with the deposition of an unbiased film on top of a biased one (sample Tb is the underlayer used in sample T).…”
Section: /19supporting
confidence: 85%
“…In fact, the stoichiometry of TiN samples is known to influence the mechanical properties of TiN films [37]. In addition, the overall amount of energy supplied to the growing film and the energy per incident particle influence film growth [23,43], which is favored in the absence of nitrogen in the gas phase.…”
Section: /19mentioning
confidence: 99%