1979
DOI: 10.1063/1.31684
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CO2 laser annealing of ion–implanted silicon

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1980
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Cited by 6 publications
(2 citation statements)
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“…However, under such conditions the energy density 'window' for controlled annealing is very narrow and the surface of the material is often damaged with even small excursions in energy density above the annealing threshold. This is the situation for COz laser (10 p m ) annealing of crystalline Si, although improvement in control of the process can be achieved by moderate heating of the sample to promote free-carrier generation and initiate stable radiation absorption (Celler et al 1979).…”
Section: Experimental Techniquementioning
confidence: 99%
“…However, under such conditions the energy density 'window' for controlled annealing is very narrow and the surface of the material is often damaged with even small excursions in energy density above the annealing threshold. This is the situation for COz laser (10 p m ) annealing of crystalline Si, although improvement in control of the process can be achieved by moderate heating of the sample to promote free-carrier generation and initiate stable radiation absorption (Celler et al 1979).…”
Section: Experimental Techniquementioning
confidence: 99%
“…Le schéma d'une installation expérimentale est représenté sur la figure 11. Le laser ,C02 est également employé quelquefois [85][86][87] ; dans ce cas l'absorption de la lumière ne se fait que pair porteurs libres et varie très fortement avec la température [87]. [Principle of the set-up used for continuous laser beam annealing with focus and scanning over the sample.]…”
Section: Nouvel éTat Stable : Structure Cristalline-unclassified