2009
DOI: 10.3155/1047-3289.59.5.514
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Coarse Particulate Matter Apportionment around a Steel Smelter Plant

Abstract: The results from a study carried out in the urban area of Genoa, Italy, where a large steel smelter recently shut down are presented. We had the opportunity to sample particulate matter (PM) before and after plant closure and, therefore, to measure the changes in concentration and composition of PM 10 (atmospheric PM with aerodynamic diameter Ͻ10 m). Elemental concentrations of Na to Pb were obtained through energy dispersive X-ray fluorescence (ED-XRF), and the contributions of specific sources of PM 10 were … Show more

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Cited by 6 publications
(4 citation statements)
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“…Some XRF devices may offer flexibility in targeting specific elements of interest (e.g., tracers of potential PM sources or PTEs), which can be simultaneously quantified. The technique has a wide range of targetable elements, and two or more irradiation conditions can be set to optimize the analysis for low-Z (Na to Si/P) and medium-to-high-Z elements (e.g., S to Pb) [116,127,186]. XRF is a quick and straightforward tool for gathering chemical data on PM macrocomponents [115].…”
Section: Xrfmentioning
confidence: 99%
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“…Some XRF devices may offer flexibility in targeting specific elements of interest (e.g., tracers of potential PM sources or PTEs), which can be simultaneously quantified. The technique has a wide range of targetable elements, and two or more irradiation conditions can be set to optimize the analysis for low-Z (Na to Si/P) and medium-to-high-Z elements (e.g., S to Pb) [116,127,186]. XRF is a quick and straightforward tool for gathering chemical data on PM macrocomponents [115].…”
Section: Xrfmentioning
confidence: 99%
“…The quantitative XRF output is obtained in elemental concentrations in ng/m 3 by calculating the sensitivity factor for each element using standard reference materials, mass concentration in mass/area (also known as elemental thickness) from the XRF measurements, analyzed filter area, and sampling volume rate [110,118,120,121,163,[186][187][188][189][190][191] Uncertainties in the XRF measurements generally lie within the 5-15% range for most elements except for those with small atomic masses [120] or with low concentrations near instrument DLs [116]. Low-Z elements are also prone to cause X-ray self-attenuation and might require correction factors during quantification [116,186,190]. Generally, MDLs as low as 1-2 ng/m 3 for a selected number of elements have been reported [116,117,120,127,192,193].…”
Section: Xrfmentioning
confidence: 99%
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