2014
DOI: 10.1063/1.4881816
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Coexistence of bunching and meandering instability in simulated growth of 4H-SiC(0001) surface

Abstract: Articles you may be interested inInfluence of the surface morphology on the channel mobility of lateral implanted 4H-SiC(0001) metal-oxidesemiconductor field-effect transistors

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Cited by 34 publications
(23 citation statements)
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“…We believe that such relations can be found soon and that they are also true for real crystal surfaces. Our model is easily generalizable to higher dimensions where new phenomena are expectedbunching of straight steps, step meandering of equidistant steps and simultaneous step bunching and meandering [4,31,32].…”
Section: Discussionmentioning
confidence: 99%
“…We believe that such relations can be found soon and that they are also true for real crystal surfaces. Our model is easily generalizable to higher dimensions where new phenomena are expectedbunching of straight steps, step meandering of equidistant steps and simultaneous step bunching and meandering [4,31,32].…”
Section: Discussionmentioning
confidence: 99%
“…Because surface phenomena are complex, we adopt the strategy of divide-and-conquer to study them step-by-step. To clearly observe the effects of the change due to component deviation in the ambient phase at equilibrium, we do not consider the second-nearest-neighbor interaction between atoms [51] in crystals, the Ehrlich-Schwoebel effect [52,53], elastic interactions [54], surface reconstruction [14], and point-contact-type step-step attraction [2].…”
Section: Introductionmentioning
confidence: 99%
“…4E). It is known that ISB usually induces step bunching during crystal growth processes [1,10,11,17]. ISB also slows down nucleation at terraces, because it hinders the jumping of particles to neighboring sites.…”
Section: Stability Diagramsmentioning
confidence: 99%
“…[17]. The model was used in GaN N-plane simulations [18] where experimental results were compared with simulated ones and several methods of surface smoothening were proposed.…”
Section: Numerical Modelmentioning
confidence: 99%