1994
DOI: 10.1103/physrevb.50.1309
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Coherence effects in the low-temperature Hall coefficient of the heavy-fermion systemUPd2Al3

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Cited by 9 publications
(4 citation statements)
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“…4). The first was also observed in earlier measurements on UPd 2 Al 3 (0 0 1) thin films, where the field was applied parallel to [0 0 1], current also along [1 0 0] [7]. The second feature was present but much weaker in these previous measurements.…”
supporting
confidence: 62%
“…4). The first was also observed in earlier measurements on UPd 2 Al 3 (0 0 1) thin films, where the field was applied parallel to [0 0 1], current also along [1 0 0] [7]. The second feature was present but much weaker in these previous measurements.…”
supporting
confidence: 62%
“…1 and known from literature. [4,33,34] This can be described as ρ dc = ρ 0 + AT 2 , where A = 2.3 · 10 −7 Ωcm/K 2 , similar to previous studies. [35,36] Such a quadratic temperature dependence is usually taken as an indicator for Fermi-liquid behavior, which should lead to a characteristic frequency dependence of the relaxation rate as well.…”
Section: Frequency-dependent Relaxation Ratementioning
confidence: 53%
“…a) The Hall coefficient in the zero-temperature limit, remarkably large in URu 2 Si 2 (R H ∼ 10 −8 m 3 /C corresponding to 0.05 carriers per U in a simple one-band picture [14,25]), exceeds by a factor of twenty the same quantity in UPd 2 Al 3 [26]. Note that neither multi-band effects (which would eventually reduce the total R H ) or skew scattering (estimated in the zero-temperature limit using the Pauli susceptibility [25]) can explain the magnitude of R H in URu 2 Si 2 .…”
mentioning
confidence: 99%
“…Moreover, by comparing the physical properties of URu 2 Si 2 and UPd 2 Al 3 at low temperatures, one finds three independent lines of evidence suggesting that the carrier density in the former is one order of magnitude smaller than the latter. a) The Hall coefficient in the zero-temperature limit, remarkably large in URu 2 Si 2 (R H ∼ 10 −8 m 3 /C corresponding to 0.05 carriers per U in a simple one-band picture [14,25]), exceeds by a factor of twenty the same quantity in UPd 2 Al 3 [26]. Note that neither multi-band effects (which would eventually reduce the total R H ) or skew scattering (estimated in the zero-temperature limit using the Pauli susceptibility [25]) can explain the magnitude of R H in URu 2 Si 2 .…”
mentioning
confidence: 99%