Abstract:INTRODUCTIONThis paper presents a model for RF broadband ultrasonic A-scans obtained from materials composed of microstructures, in which isolated flaws or impurities may exist. The model incorporates both the RF phase and magnitude differences between the microstructure and coherent flaw echo spectra. An adaptive implementation of the maximumlikelihood estimator (MLE) is presented for estimating A-scan amplitudes associated with coherent scatterers embedded in grain echoes. The adaptive implelllentation is mo… Show more
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