Cold electronics for "Giant" Liquid Argon Time Projection Chambers

Radeka, V.; Chen, Hucheng; Deptuch, G.; Geronimo, G. De; Lanni, F.; Li, Shaorui; Nambiar, Neena; Rescia, S.; Thorn, C.; Yarema, R.; Yu, B. X.

doi:10.1088/1742-6596/308/1/012021

Cited by 47 publications

(41 citation statements)

References 6 publications

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“…For a wireplane configuration typically set up for LArTPCs, a track induced by a minimum ionizing particle leads to a number of about 6000 electrons per wire at the read-out [56]. This corresponds to about 1 fC of charge.…”

Section: Wireplane Read-out and Signal Formationmentioning

confidence: 99%

“…By using the latest cryogenic preamplifier technologies, one can partly compensate the signal attenuation and significantly improve the signal-to-noise ratio [56,[62][63][64]. The attenuation of the detector output signals by contaminant molecules grows exponentially with the drift time.…”

Section: The Argontube Detectormentioning

confidence: 99%

“…The Argontube read-out has recently been upgraded from 'warm' preamplifiers [24], which were installed outside the cryostat, to cryogenic ones (LARASIC4 [56,62,63]). The latter read-out scheme offers many advantages reaching from easier cryostat design (multiplexing), an important aspect for future large LArTPCs, to a substantially higher signal-to-noise ratio.…”

Section: Read-out Data-acquisition and Triggering Systemsmentioning

confidence: 99%

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Studies with a Liquid Argon Time Projection Chamber

Schenk

2015

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Section: Wireplane Read-out and Signal Formationmentioning

confidence: 99%

Section: The Argontube Detectormentioning

confidence: 99%

Section: Read-out Data-acquisition and Triggering Systemsmentioning

confidence: 99%

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Studies with a Liquid Argon Time Projection Chamber

Schenk

2015

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“…According to physics simulations, Equivalent Noise Charge (ENC) of DUNE single-phase far detector should be less than 1/9 of the expected worse case instantaneous charge arriving at the APA from a minimum-ionizing particle (MIP), which requires ENC for induction wires to be less than 1000e -. As an enabling technology for noble liquid detectors in neutrino experiments, readout electronics developed for extremely low temperatures (77K-89K) decouples the electrode and cryostat design from the readout design [3]. With electronics integrated with detector electrodes, the noise is independent of the fiducial volume and much lower than with readout electronics at room temperature.…”

Section: Introductionmentioning

confidence: 99%

The Development of Front-End Readout Electronics for ProtoDUNE-SP LAr TPC

Gao¹,

Berns²,

Chen³

et al. 2018

Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP-17)

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“…The obvious advantage to placing the readout electronics inside the cryostat is to minimize the input capacitance of any front-end amplifiers and thereby minimize noise [2]. Beyond that, there are considerable advantages to cryogenic operation.…”

Section: Introductionmentioning

confidence: 99%

Cryogenic Lifetime Studies of 130 nm and 65 nm nMOS Transistors for High-Energy Physics Experiments

Hoff

Deptuch

et al. 2015

IEEE Trans. Nucl. Sci.

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The Deep Underground Neutrino Experiment will use unsurpassed quantities of liquid argon to fill a time projection chamber. Research is under way to place the electronics inside the cryostat. For reasons of efficiency and economics, the lifetimes of these circuits must be well in excess of 20 years. The principle mechanism for lifetime degradation of MOSFET devices and circuits operating at cryogenic temperatures is hot carrier degradation. It is therefore imperative that studies be performed in candidate technologies to explore hot carrier degradation and to determine if such technologies are suitable for these rigorous requirements. In this paper, 130 nm and 65 nm nMOS transistors operating at cryogenic temperatures are examined. The results show that both technologies achieve the lifetimes required by the experiment. Minimal design changes are necessary in the case of the 130 nm process and no changes whatsoever are necessary for the 65 nm process.

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Cold electronics for "Giant" Liquid Argon Time Projection Chambers

Cited by 47 publications

References 6 publications

Studies with a Liquid Argon Time Projection Chamber

Studies with a Liquid Argon Time Projection Chamber

The Development of Front-End Readout Electronics for ProtoDUNE-SP LAr TPC

Cryogenic Lifetime Studies of 130 nm and 65 nm nMOS Transistors for High-Energy Physics Experiments

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