‘Collapsing rings’ on Schottky electron emitters

Bronsgeest, M. S.; Kruit, P.

doi:10.1016/j.ultramic.2010.05.004

Cited by 12 publications

(7 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This phase transition was reversibly observed depending on the temperature, and transition from p(1×1) to c(4×2) + c(2×4) was also observed in the cooling process. These structural changes on the tip surface are in excellent agreement with the previously reported results from the planer-sample [12,[13][14][15][16][17][18][19][20][21][22][23][24][25][26]. This confirms that the planer-sample can be used as the simulating sample of the emitter tip.…”

Section: Tof-simssupporting

confidence: 91%

“…They found that the surface periodicity was changed from a c(4×2) + c(2×4) double domain superstructure to p(1×1) between 1000 K and 1400 K [12][13][14]15], and that the reduced work function of the surface was accompanied by a change in the periodicity [12,13]. It has been expected that the surfaces on the emitter tip will be directly measured and that a well-defined sample will be verified as the simulation of the emitter tip; the structural model of the emitter surface will be proposed through analyses of not only the periodicity but also the bonding states of Zr, O, and W; and the mechanism of (001) selectivity will be revealed through comparing the other surfaces on the emitter, such as (110) and (112) [16][17][18][19].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Surface characterization of zirconia-coated tungsten Schottky emitters by using RHEED, AES, and TOF-SIMS

Matsunaga

Katagiri

2015

Surface Science

View full text Add to dashboard Cite

Section: Tof-simssupporting

confidence: 91%

Section: Introductionmentioning

confidence: 99%

Surface characterization of zirconia-coated tungsten Schottky emitters by using RHEED, AES, and TOF-SIMS

Matsunaga

Katagiri

2015

Surface Science

View full text Add to dashboard Cite

“…Most of the energy broadening due to the Boersch effect usually occurs in the crossover, in this case very close to the tip. A recent calculation by Bronsgeest et al 29 shows that about 80% of the broadening occurs in the first 100 m. This is where the energy of the electrons is mainly determined by the field on the facet, which is equal in the suppressorless configuration. Therefore it can be said that the energy broadening in the case of suppressorless Schottky emitter will not be significantly different from the standard Schottky emitter.…”

Section: Discussionmentioning

confidence: 96%

Concept and operation of Schottky emitter without suppressor electrode

Dokania

Kruit

2009

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

Self Cite

View full text Add to dashboard Cite

The Schottky electron emitter is the most frequently used electron source in electron microscopes. A suppressor electrode around the emitter is usually employed to prevent emission from the shank of the cathode. A concept of operating the Schottky emitter without the suppressor electrode is proposed with the aim of lowering the potential of the extractor electrode. Simulation results show that if the suppressor electrode is removed, then the same field as for the standard configuration can be obtained at the tip apex at an extraction voltage of 2265 V instead of 5000 V. The total emission from the shank region is calculated by estimating the emission area of the shank, taking into the account the different work functions of the crystal facets. The total emission for typical operating parameters is calculated to rise from 500 to 668 A. The total emission from the shank and the filament of the Schottky emitter is measured experimentally in two different configurations, which match with the simulated results. The measured total emission of 450-750 A confirms the idea that a Schottky emitter can be operated without suppressor, all the more so because the power at the extractor aperture is even reduced as a result of the lower acceleration voltage.

show abstract

“…For example, simple monitoring of the mean pixel value of the high magnification images during data collection can indicate when the FEG tip is terracing (Bronsgeest and Kruit, 2010). This event may last several hours and will likely degrade data quality during the intensity dip as shown in Figure 6.…”

Section: Microscope Performance and Quality Checksmentioning

confidence: 99%

Best practices for managing large CryoEM facilities

Alewijnse

Ashton

Chambers

et al. 2017

Journal of Structural Biology

View full text Add to dashboard Cite

This paper provides an overview of the discussion and presentations from the Workshop on the Management of Large CryoEM Facilities held at the New York Structural Biology Center, New York, NY on February 6–7, 2017. A major objective of the workshop was to discuss best practices for managing cryoEM facilities. The discussions were largely focused on supporting single-particle methods for cryoEM and topics included: user access, assessing projects, workflow, sample handling, microscopy, data management and processing, and user training.

show abstract

‘Collapsing rings’ on Schottky electron emitters

Cited by 12 publications

References 23 publications

Surface characterization of zirconia-coated tungsten Schottky emitters by using RHEED, AES, and TOF-SIMS

Surface characterization of zirconia-coated tungsten Schottky emitters by using RHEED, AES, and TOF-SIMS

Concept and operation of Schottky emitter without suppressor electrode

Best practices for managing large CryoEM facilities

Contact Info

Product

Resources

About