2009
DOI: 10.1016/j.ultramic.2008.10.008
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Column-by-column compositional mapping by Z-contrast imaging

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Cited by 72 publications
(60 citation statements)
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“…Below, we present experimental results on the epitaxial growth of different cathode film materials based on conventional TEM (including electron diffraction) and aberration-corrected STEM that uses a high-angle annular dark-field (HAADF) mode to image atomic columns of high-Z (atomic number) atoms [56,57]. The intensity of the columns is proportional to Z α (where α is dependent on inner collection angle and detector geometry and approaches a limit of 2), whereas Z should be normalized to the linear density of atoms along a column.…”
Section: Experimental Results From Transmission Electron Microscopy Smentioning
confidence: 99%
“…Below, we present experimental results on the epitaxial growth of different cathode film materials based on conventional TEM (including electron diffraction) and aberration-corrected STEM that uses a high-angle annular dark-field (HAADF) mode to image atomic columns of high-Z (atomic number) atoms [56,57]. The intensity of the columns is proportional to Z α (where α is dependent on inner collection angle and detector geometry and approaches a limit of 2), whereas Z should be normalized to the linear density of atoms along a column.…”
Section: Experimental Results From Transmission Electron Microscopy Smentioning
confidence: 99%
“…In relation to the first approach, we have developed a phenomenological method to determine the composition of materials, with atomic column resolution. This method is based on the analysis of integrated intensities of aberration-corrected Z-contrast images [15].…”
Section: Quantitative Z-contrast Imagingmentioning
confidence: 99%
“…We have developed both phenomenological [15] and simulation [16] approaches to determine the composition with atomic column resolution from aberration-corrected high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images, that can be applied to a wide range of materials problems, ranging from compositionally homogeneous phases to heterogeneous nanostructures including millions of atoms. The strain distribution of nanostructures can be determined from the obtained compositional maps, and compared with strain maps obtained by analysing phase-contrast HRTEM images.…”
Section: Introductionmentioning
confidence: 99%
“…Nowadays there are multiple options to interpret HAADF images in quantitative terms. It is possible to study the intensities associated with atomic columns through statistical analysis [4], phenomenological procedures [5] or to compare with simulations [6]. But in the case of the analysis of nanostructures like QDs all of these methodologies are affected by the dependence of the HAADF intensities on the strain fields originating from the nanostructure that alter the intensities [7], making the precise quantification of HAADF images a complicated task.…”
mentioning
confidence: 99%