2019 IEEE International Ultrasonics Symposium (IUS) 2019
DOI: 10.1109/ultsym.2019.8925989
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Combination of direct, half-skip and full-skip TFM to characterize defect(II)

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Cited by 3 publications
(8 citation statements)
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“…Multi-view imaging is also explored as it has recently proven to be an interesting technique for defect characterization [ 10 , 12 , 25 ]. A view is constituted of two ray paths: a transmitting path from the probe to the defect, and a receiving path from the defect to the probe.…”
Section: Methodsmentioning
confidence: 99%
“…Multi-view imaging is also explored as it has recently proven to be an interesting technique for defect characterization [ 10 , 12 , 25 ]. A view is constituted of two ray paths: a transmitting path from the probe to the defect, and a receiving path from the defect to the probe.…”
Section: Methodsmentioning
confidence: 99%
“…Por esses motivos, esta técnica é consagrada na literatura. Consequentemente, surgiram várias técnicas de processamento de imagens com o objetivo de melhorar a qualidade das imagens TFM [5,6,7,8,9,10,11,12,13,14]. Dentre essas, destacam-se as técnicas mencionadas nos parágrafos a seguir.…”
Section: Lista De Figurasunclassified
“…A fim de melhorar a reconstrução dos defeitos nas imagens TFM, Han et al [6,7] propôs a geração de uma imagem TFM final a partir do somatório de três imagens TFM que foram reconstruídas usando a mesma aquisição FMC. Cada imagem é gerada através do emprego de três configurações diferentes de reconstrução.…”
Section: Lista De Abreviaturasunclassified
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