Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals

Kobler, Aaron; Kashiwar, Ankush; Hahn, Horst; Kübel, Christian

doi:10.1016/j.ultramic.2012.12.019

Cited by 117 publications

(87 citation statements)

References 61 publications

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“…9 The combination of orientation mapping with in situ TEM methods has been powerful in resolving microstructure changes at elevated temperatures, 4 and those induced by mechanical deformation. [38][39][40] The addition of coordinated modeling further extends this capability. While the ion and target species were selected in this study specifically because they undergo grain growth, this technique can in principle be utilized to probe the fundamental mechanisms of grain boundary migration during irradiation in essentially any crystalline material system.…”

Section: -3mentioning

confidence: 99%

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

Bufford

Abdeljawad

Foiles

et al. 2015

Applied Physics Letters

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Nanostructuring has been proposed as a method to enhance radiation tolerance, but many metallic systems are rejected due to significant concerns regarding long term grain boundary and interface stability. This work utilized recent advancements in transmission electron microscopy (TEM) to quantitatively characterize the grain size, texture, and individual grain boundary character in a nanocrystalline gold model system before and after in situ TEM ion irradiation with 10 MeV Si. The initial experimental measurements were fed into a mesoscale phase field model, which incorporates the role of irradiation-induced thermal events on boundary properties, to directly compare the observed and simulated grain growth with varied parameters. The observed microstructure evolution deviated subtly from previously reported normal grain growth in which some boundaries remained essentially static. In broader terms, the combined experimental and modeling techniques presented herein provide future avenues to enhance quantification and prediction of the thermal, mechanical, or radiation stability of grain boundaries in nanostructured crystalline systems.

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Section: -3mentioning

confidence: 99%

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

Bufford

Abdeljawad

Foiles

et al. 2015

Applied Physics Letters

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“…The HAADF-STEM image (figure 2a) fits to the expected multilayer structure of The D-STEM experiments were performed using a Tecnai F20 ST (Philips) operated at 200 kV in µp-STEM mode and equipped with a NanoMegas ASTAR system, which was initially designed for automated crystal orientation mapping (ACOM) [33], e.g. for orientation analysis of nanocrystalline materials [34]. For the data acquisition, spot size 8, gun lens 6, extraction voltage of 3.9kV and a 30 µm C2 aperture were adopted.…”

Section: Application To Amorphous Zrfe/zro2 Multilayersmentioning

confidence: 99%

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses

Wang

Feng

et al. 2016

Ultramicroscopy

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To overcome some of the challenges in characterizing heterogeneous nanostructured amorphous materials, we developed a new TEM method, RDF imaging, combining scanning transmission electron microscopy diffraction mapping with radial distribution function (RDF) analysis followed by hyperspectral analysis, to enable phase analysis and mapping of heterogeneous amorphous structures purely based on their short-and medium range atomic order. We applied this method to an amorphous zirconium oxide and zirconium iron multilayer system, demonstrating an extreme sensitivity of the method to small atomic packing variations. This approach has great potential to understand local structure variations in glassy composite materials and to provide new insights to correlate structure and properties of glasses.

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“…While it is possible to perform quasistatic experiments using scanning nanobeam diffraction over these relatively long periods of time, 13 it is not experimentally practical for continuous in situ TEM experiments that must be performed without stopping the experiment. Recently, the use of millisecond acquisition times of direct electron detectors has been shown to retain the precision of the strain measurement 14 and we have recently demonstrated that it can be used to acquire strain maps of a large field of view.…”

mentioning

confidence: 99%

Local and transient nanoscale strain mapping during in situ deformation

Gammer

Kacher

Czarnik³

et al. 2016

Applied Physics Letters

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The mobility of defects such as dislocations controls the mechanical properties of metals. This mobility is determined both by the characteristics of the defect and the material, as well as the local stress and strain applied to the defect. Therefore, the knowledge of the stress and strain during deformation at the scale of defects is important for understanding fundamental deformation mechanisms. Here, we demonstrate a method of measuring local stresses and strains during continuous in situ deformation with a resolution of a few nanometers using nanodiffraction strain mapping. Our results demonstrate how large multidimensional data sets captured with high speed electron detectors can be analyzed in multiple ways after an in situ TEM experiment, opening the door for true multimodal analysis from a single electron scattering experiment.

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Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals

Cited by 117 publications

References 61 publications

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses

Local and transient nanoscale strain mapping during in situ deformation

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