2000
DOI: 10.1016/s0003-2670(00)01139-9
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Combination of X-ray photoelectron and solid-state 13C nuclear magnetic resonance spectroscopy in the structural characterisation of humic acids

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Cited by 115 publications
(60 citation statements)
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“…The information yielded by the polyimide spectrum was helpful to characterize the second reference sample, a wellinvestigated HA standard sample (Monteil-Rivera et al 2000;Sierra et al 2005;Plucinski et al 2007;Rodrigues et al 2008). The spectrum is displayed in Fig.…”
Section: Reference Samplesmentioning
confidence: 99%
See 1 more Smart Citation
“…The information yielded by the polyimide spectrum was helpful to characterize the second reference sample, a wellinvestigated HA standard sample (Monteil-Rivera et al 2000;Sierra et al 2005;Plucinski et al 2007;Rodrigues et al 2008). The spectrum is displayed in Fig.…”
Section: Reference Samplesmentioning
confidence: 99%
“…Our approximation of the elemental compositions yields values close to the analytical data, directly taken from the supply company, Sigma Aldrich. In Monteil-Rivera et al (2000), the elemental composition has been determined with an elemental analyzer and with X-ray photoelectron spectroscopy (XPS). Sierra et al (2005) used solid-state CP/MAS 13 C-NMR spectroscopy (CP=cross polarization, MAS=magic angle spinning) for the chemical analysis of this HA sample.…”
Section: Reference Samplesmentioning
confidence: 99%
“…The concentration of elements can be determined with an accuracy of up to 0.1 atm%. Chemical states of elements can also be determined by peak synthesis (Briggs and Seah 1990;Monteil-Rivera et al 2000;Olivella et al 2002;Paoletti et al 2003).…”
Section: Introductionmentioning
confidence: 99%
“…This technique has many advantages in that it is nondestructive, and is surface sensitive, with chemical shift (Faude and Goschnick 1997;Pietrzak and Wachowska 2006). In addition, the use of XPS core-level peaks to derive chemical structure information of organic solids by fitting peak intensity and position features, is the standard XPS application (Briggs and Seah 1990;Monteil-Rivera et al 2000;Olivella et al 2002a,b;Paoletti et al 2003;Qi et al 2006). Therefore, the XPS technique has been used to investigate the elemental composition and chemical states of aerosol surfaces (Albers et al 2000;Hutton and Williams 2000;Zhu et al 2001;Lazzeri et al 2003;Paoletti et al 2003;Atzei and Rossi 2004;Qi et al 2006;Gilham et al 2008).…”
Section: Introductionmentioning
confidence: 99%