Combinatorial experiment in Ni–Ti thin films by laser interference structuring

Liu, K.W.; Gachot, Carsten; Leibenguth, P.; Mücklich, Frank

doi:10.1016/j.apsusc.2005.01.123

Cited by 2 publications

(4 citation statements)

References 6 publications

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“…Up o recent years, to form laser-induced surface structures in solids, interference of two or more laser beams has been used [4][5][6][7][8][9][10]. In practice, a system of the interference beams can be formed by both one source with a light divider and a proper system of mirrors or slits and by a bunch (a grating) of the identical lasers [13].…”

Section: The Laser-induced Surface Structuresmentioning

confidence: 99%

“…Let us consider a condensed matter (semiconductor), an outer surface of which is irradiated by two coherent light beams (CLBs) with an equal frequency that satisfies the inequality, g       (  is the carrier average energy and ε g is the bandgap of this semiconductor). These CLBs, as known [2][3][4][5][6][7][8][9][10], form an interference pattern on a condensed matter surface an interference pattern (Fig. 1).…”

Section: The Laser-induced Grating Of the Refraction Index In Semiconmentioning

confidence: 99%

“…The special interest is caused by the laser-induced spatially periodic surface structures. As a rule, they are created at interference of a few laser beams on solid surface [2][3][4][5][6][7][8][9][10]. This technology has already found practical application, in particular, during melting metals [6], and making printing plates [11].…”

Section: Introductionmentioning

confidence: 99%

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The Rahman-Nat diffraction on a thin laser-induced grating of the refractive index in semiconductors

Semchuk¹

2009

Semicond. phys. quantum electron. optoelectron.

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Studied in this work is the Rahman-Nat diffraction on a thin grating of refractive index in semiconductor, which was created by an interference pattern of two coherent laser beams. Numeral calculations showed that the maximal diffraction efficiency for the Rahman-Nat diffraction in the first order was 28.2 % for a purely phase grating at its thickness z~200, and 4.8 % for a purely amplitude grating. It was also ascertained, that waves belonging to the nearby diffraction orders differ from each other by π/2 in their phase. ; published online 30.10.09. r k k J J J J J E cN J

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Section: The Laser-induced Surface Structuresmentioning

confidence: 99%

Section: The Laser-induced Grating Of the Refraction Index In Semiconmentioning

confidence: 99%

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The Rahman-Nat diffraction on a thin laser-induced grating of the refractive index in semiconductors

Semchuk¹

2009

Semicond. phys. quantum electron. optoelectron.

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“…Based on the reflection from the measured surface of a white light beam into an interferometric objective, this technique provides quantitative information for much larger areas (up to some square millimetres) with a vertical resolution around ten nanometers. Thus, WLI is another technique that can be used for height measurement in the vertical direction, along with complete morphological and analytical data from SEM (List et al, 2005;Liu, 2005). However, these combinatorial experiments are usually done at different locations on the sample, hindering the correlation between local composition and corresponding quantitative topography.…”

Section: Introductionmentioning

confidence: 99%

COMBINING WLI AND SEM TECHNIQUES TO OBTAIN A 4D SURFACE IMAGE OF A ppHDMSO/AlCeO3 NANOCOMPOSITE

Buchheit¹,

Arnoult²,

Eddoumy³

et al. 2011

Image Anal Stereol

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Compositional images from a SEM (scanning electron microscope) are sometimes complemented by quantitative topographical data from devices such as an AFM (atomic force microscope) or WLI (white light interferometer). Indeed, even if a SEM could provide both kinds of information (composition and topography), the topographical data are incomplete because the SEM does not allow measuring the vertical dimension (i.e., perpendicular to the measurement plane). Thus these two kinds of information are usually measured using two different techniques, and at different locations on the sample. Mean values of surface composition are then linked to mean values of topography, and as a consequence this approach does not allow precisely linking a local topographical peak to its corresponding composition. The present work deals with a SEM/WLI combination methodology, based on the characterization, at the same location, of a nanocomposite (nanoparticles of AlCeO 3 dispersed in a plasma-polymerized hexamethyldisiloxane ppHMDSO matrix and deposited by atmospheric plasma on a glass substrate) developed for improving anticorrosion properties. SEM images allow the supposition that the protuberances (peaks) observed on the surface of a specimen are linked to the nanoparticles dispersed in the polymer coating, but this link is not fully convincing. Thanks to a precise localization method, SEM compositional data and WLI topographical data are here measured at the same location. The recombination of both signals to form a 4D image (3D geometry and 1D composition) allows linking protuberances to nanoparticles aggregates without ambiguity. This composite image appears to be an interesting new tool (at the scale of observation, i.e., hundreds of micrometers) for the study of nanostructured coatings.

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Combinatorial experiment in Ni–Ti thin films by laser interference structuring

Cited by 2 publications

References 6 publications

The Rahman-Nat diffraction on a thin laser-induced grating of the refractive index in semiconductors

The Rahman-Nat diffraction on a thin laser-induced grating of the refractive index in semiconductors

COMBINING WLI AND SEM TECHNIQUES TO OBTAIN A 4D SURFACE IMAGE OF A ppHDMSO/AlCeO3 NANOCOMPOSITE

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