2011
DOI: 10.1109/jphotov.2011.2172188
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Combined Effects of Shunt and Luminescence Coupling on External Quantum Efficiency Measurements of Multijunction Solar Cells

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Cited by 45 publications
(26 citation statements)
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“…Carriers are generated by the absorption of both solar radiation, n i sun , and coupled spontaneous emission from the adjacent largerbandgap i À 1 junction, [9][10][11][12] n iÀ1 sp;lower , where N iÀ1 sp;lower…”
Section: Auger Loss Energy Lost To Auger Recombinationmentioning
confidence: 99%
See 1 more Smart Citation
“…Carriers are generated by the absorption of both solar radiation, n i sun , and coupled spontaneous emission from the adjacent largerbandgap i À 1 junction, [9][10][11][12] n iÀ1 sp;lower , where N iÀ1 sp;lower…”
Section: Auger Loss Energy Lost To Auger Recombinationmentioning
confidence: 99%
“…Moreover, most commercial software packages consider both radiative and non-radiative recombination [4][5][6] however, they typically do not include some important aspects related to radiative recombination, such as photon recycling 7,8 within a given junction and spontaneous emission coupling between adjacent junctions. [9][10][11][12] On the contrary, detailed balance models are only capable of clarifying the fundamental limitations of ideal solar cells by neglecting many important mechanisms that occur in real devices. It is, therefore, necessary to develop a semi-analytical model that not only takes into account all of the important properties of materials and device structures to provide a more thorough understanding of photovoltaic solar cells, but also enables fast computation to offer basic guidance for practical device design.…”
Section: Introductionmentioning
confidence: 99%
“…In the presence of a non-flat slope around the operating point (i.e., in the presence of low shunt resistance), the EQE magnitude would be lower than expected. Traditionally, it has been attributed a low shunt resistance to the Ge subcell because of its low bandgap [8,13], thus justifying the need of V¡,i as and special light bias conditions during its EQE characterization [8,13]. While it might be true in some cases, we believe that, in state-of-the-art triple-junction, solar cells grown by highly mature MOVPE processes low shunt resistances are less common.…”
Section: Low Vpf Versus Shunt Resistance and Luminescent Coupling As mentioning
confidence: 93%
“…This artifact consists of a lower than expected EQE of the subcell under test plus the simultaneous measurement of some response in wavelengths corresponding to another subcell. The origin of the so-called measurement artifact has been thoroughly discussed in recent years and has been related to a variety of causes such as a low shunt resistance in any junction [8,9], luminescent coupling [10][11][12] or a combination of both [13]. In brief, these papers show that the EQE of a subcell is not only determined by its own properties but also by the electro-optical interactions with other subcells in the stack.…”
Section: Introductionmentioning
confidence: 99%
“…8,23 In addition, the photocurrent generation due to light unabsorbed by the upper subcells is much smaller compared with the LC current generation. 24 Thus, we assumed that all of the photocurrent generation in the Ge bottom cell by GaAs middle cell excitation is due to the LC effect. Also, the voltage distribution of the limiting Ge bottom cell is considered spatially uniform since the tunnel diode in between the GaAs and Ge subcells is heavily doped.…”
Section: Quasi-two-dimensional Simulation Modelmentioning
confidence: 99%