Combined X-ray-electron imaging techniques: Limitations on lateral resolution

The performance of an Al x-ray transmission photocathode was experimentally characterized by measuring the total electron yield from backsurface photocathodes of varying thickness. It was demonstrated that the backsurface electron yield is proportional to the x-ray photocurrent transmitted through the photocathode for thicknesses thicker than the optimum thickness. The optimum photocathode thickness with the highest conversion efficiency was found to be approximately 70nm at 2.963keV. An escape depth of the secondary electrons was determined to be approximately 13nm from the yield-versus-thickness data fitted with a semiempirical equation. Using this parameter, the dependence of the optimum photocathode thickness on the x-ray energy was calculated for the 30–10000eV range. As one example of imaging applications, different photoemission images in the transmission and reflection modes are also presented.

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Spectrum of a superconducting tunnel detector in a simple spherical model of electron loss

Kozin

Romashkina

2012

Bull. Russ. Acad. Sci. Phys.

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Combined X-ray-electron imaging techniques: Limitations on lateral resolution

Cited by 3 publications

References 37 publications

Emission statistics of X-ray induced photoelectrons and its comparison with electron- and ion-induced electron emissions

Emission statistics of X-ray induced photoelectrons and its comparison with electron- and ion-induced electron emissions

Characterization of x-ray photocathode in transmission mode for imaging application

Spectrum of a superconducting tunnel detector in a simple spherical model of electron loss

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