Combined XPS and ToF-SIMS study of miscible polymer blend surfaces: polystyrene/poly(2,6-dimethyl-1,4-phenylene oxide) (PS/PDMPO)

Mass Spectrometry of Polymers and Polymer Surfaces

“…Both end groups and repeat units can be determined. SSIMS data is used to probe many different features of polymer samples, including tacticity, polymer blends (stereoregular PP, PS + poly(dimethyl phenylene oxide), different molecular weight PS, PS + poly(vinylpyrrolidone), PMMA + ethylene-tetrafluoroethylene, PS + fluorine functional end-capped PS 289 ), functional end groups, and copolymer analysis. ,,, Two valuable compilations of low-resolution SSIMS fragment mass spectra have also been published, , and a high-resolution library is being generated . These compilations can be a great aid in identifying unknown polymers from fragment ions.…”

Surface Characterization of C60-Containing Poly(ethyl methacrylate)/Poly(ethyl methacrylate) Blends

“…ToF - SIMS Characterization. ToF-SIMS has been increasingly used to characterize the surfaces of polymer blends. − The positive ToF-SIMS spectrum of the PEMA film is shown in Figure (top). Cursory investigation of the spectrum reveals that the secondary ions emitted from the film surface are mainly the low-mass species ( m / z = 0−150), such as CH 3 + ( m / z = 15), C 2 H 5 + ( m / z = 29), and OCOC 2 H 5 + ( m / z = 73).…”

Surface Studies of Polymers with a Well-Defined Segmental Length by ToF-SIMS and XPS. Relationship between the Surface Chemical Composition and Segmental Length

“…This limits the applications of ToF-SIMS in quantitative analysis of polymer surfaces. Only a few studies have been reported on the quantification of polymer surfaces by combining XPS and ToF-SIMS, such as copolymers − and polymer blends. , Briggs and Ratner 24 studied the random copolymers of ethyl methacrylate (EMA) and hydroxyethyl methacrylate (HEMA). The relative intensities of the characteristic fragment peaks from the EMA−HEMA copolymers were related to the bulk composition.…”