Combining Near-Field Scanning Microwave Microscopy With Transport Measurement for Imaging Current-Obstructing Defects in HTS Films

Dizon, Jonathan R.; Wang, Xiang; Aga, Roberto S.; Wu, Judy

doi:10.1109/tasc.2007.899569

Cited by 6 publications

(2 citation statements)

References 8 publications

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“…Because this probe frequency is outside the resonant band, the induced current remains in the vicinity of the probe, so that the IMD is also generated in the vicinity of the probe, making this a near field technique. This is thus similar to the near-field scanning microscope used elsewhere [11]- [12], which when combined with an ultrahigh resolution probe is particularly useful for identifying nanoscale defects in superconductors [13]. Measuring IMD instead of harmonics presents some unique opportunities, but reflects the same physics.…”

Section: Local Measurement Of Intermodulation Distortionmentioning

confidence: 85%

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Huizen

Hamilton

Lenters

et al. 2017

IEEE Trans. Appl. Supercond.

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The 2nd and 3rd order nonlinear microwave response of a superconducting YBa 2 Cu 3 O 7 thin film resonator was synchronously measured using three input tones. This technique permits the local measurement, and hence mapping, of intermodulation distortion (IMD) inside the resonator. 2nd and 3rd order IMD measured with a fixed probe relaxed in remarkably different ways after the removal of a static magnetic field. The 2nd order IMD relaxed by two different magnetic processes, a fast process that appears related to bulk remanent magnetization, and a slow process that fits the description of Bean and Livingston. The 3rd order IMD relaxes by only one process which is distinct from the two processes controlling 2nd order relaxation.

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Section: Local Measurement Of Intermodulation Distortionmentioning

confidence: 85%

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Huizen

Hamilton

Lenters

et al. 2017

IEEE Trans. Appl. Supercond.

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“…Early detection of the hot spots is hence important but requires approaches of high sensitivity to the low-level dissipation and high spatial resolution to a microscopic hot spot. Near-field scanning microwave microscopy [6][7][8][9][10][11] (NSMM) is a promising technique for this purpose. The unique advantages of NSMM include noncontact and non-destructive detection of low-level dissipation and thermal instability.…”

Section: Introductionmentioning

confidence: 99%

Detection of low-level dissipation and thermal instability in Y Ba₂Cu₃O_{7 − δ}microbridges using low temperature near-field scanning microwave microscopy

Dizon¹,

Lu²,

Wang³

et al. 2010

Supercond. Sci. Technol.

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Near-field scanning microwave microscopy (NSMM) was combined with electrical transport measurements to detect the dynamic evolution of low-level dissipation and thermal instability in YBa 2 Cu 3 O 7−δ microbridges in the superconducting state driven by temperature, applied current and self-heating. High sensitivity NSMM enables quantitative detection of dissipation evolution starting from 3 to 4 orders of magnitude lower than the transport critical current criterion. The nonlinear step-like feature in the dynamic development of dissipation suggests a bi-modal evolution pattern of nucleation of isolated hot spots followed by their spreading/coalescence. A linear behavior prevails near the superconducting-to-normal transition.

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Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness

Dizon

Wang

2010

Journal of Applied Physics

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An improved near-field scanning microwave microscope (NSMM) combined with electrical transport measurement was applied for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ (YBCO) films. We demonstrate identification of the current-obstructing defects in thin (thickness below 300nm) YBCO films by mapping microwave-induced electrical voltage (ΔV) and reflected microwave power on the sample. In addition, the technique was also found to be suitable for characterizing electrical dissipation in thick YBCO films of a few micrometer thick. In order to improve the spatial resolution to submicron regime, we have employed a hybrid probe tip with a submicron tip diameter and operate the NSMM to its second harmonic frequency to increase hot spot microwave absorption. A much improved spatial resolution in the submicrometer range for the microwave maps was achieved while maintaining the sensitivity in the ΔV measurement.

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Combining Near-Field Scanning Microwave Microscopy With Transport Measurement for Imaging Current-Obstructing Defects in HTS Films

Cited by 6 publications

References 8 publications

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Detection of low-level dissipation and thermal instability in Y Ba₂Cu₃O_{7 − δ}microbridges using low temperature near-field scanning microwave microscopy

Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness

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Combining Near-Field Scanning Microwave Microscopy With Transport Measurement for Imaging Current-Obstructing Defects in HTS Films

Cited by 6 publications

References 8 publications

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Relaxation of Microwave Nonlinearity in a Cuprate Superconducting Resonator

Detection of low-level dissipation and thermal instability in Y Ba2Cu3O7 − δmicrobridges using low temperature near-field scanning microwave microscopy

Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness

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Detection of low-level dissipation and thermal instability in Y Ba₂Cu₃O_{7 − δ}microbridges using low temperature near-field scanning microwave microscopy