2012
DOI: 10.1007/s10894-012-9534-4
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Comment on: “Characterization of Microroughness Parameters in Titanium Nitride Thin Films Grown by DC Magnetron Sputtering” [J Fusion Energ DOI 10.1007/s10894-012-9510-z]

Abstract: In recent article [Ali Gelali. Azin Ahmadpourian. Reza Bavadi. M. R. Hantehzadeh. Arman Ahmadpourian. J Fusion Energ DOI 10.1007/s10894-012-9510-z], Ali Geleli et al. studied the PSD and RMS Roughness parameters in Titanium Nitride thin films by AFM data and used the computed fractal dimension value of micrographs to describe the surface morphology of thin films. Here, the correct form of equations and relationship between PSD and RMS will be discussed.

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Cited by 29 publications
(12 citation statements)
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“…Here, L is considered to be 3.0 μm with the sample rate of 3Mm −1 /2 = 30.12 μm −1 which specified the bandwidth limitation of PSD plots (Jakops, Duparre, & Truckenbrodt, ). On the other hand, the relationship between PSD as S(k) and frequency k is shown in the following equation and the slope of a Log S( k )‐Log k plot lead to fractal limitations (Solaymani, Ghaderi, & Nezafat, ) normalS()kkβ …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Here, L is considered to be 3.0 μm with the sample rate of 3Mm −1 /2 = 30.12 μm −1 which specified the bandwidth limitation of PSD plots (Jakops, Duparre, & Truckenbrodt, ). On the other hand, the relationship between PSD as S(k) and frequency k is shown in the following equation and the slope of a Log S( k )‐Log k plot lead to fractal limitations (Solaymani, Ghaderi, & Nezafat, ) normalS()kkβ …”
Section: Resultsmentioning
confidence: 99%
“…Moreover, lines I and II are the slopes of one and two log cycle of data, respectively, while the best fitted line is line III. Slope variation strongly depends on the data size, frequency, and spectral range (Solaymani et al, ). Therefore, in enamel out, increasing frequency lead to fractal dimension increase which are the same for interenamel, dentin, and cementum which are summarized in Tables , and , respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Recently, the physical properties of Tin + 1Xn (X = C, N; n = 1, 2, 3) 2D GL such as structural, electronic and optical properties have been investigated, all implicating a high potential for application in nano-technology [37]. Some theoretical and experimental works were focused on the electrical resistivity and conduction, elastic constants [38] and their application in the Li-ion batteries [39][40][41][42][43][44][45].…”
Section: Introductionmentioning
confidence: 99%
“…8 On the other hand, in literature, there are different studies about characterization of microroughness parameters of thin films prepared by DC magnetron sputtering. [9][10][11][12] Many theoretical and experimental studies highlighted that the rough surface morphology of thin films can be concisely characterized by fractal 9,13,14 and multifractal [15][16][17][18][19] geometry, which may be directly applied for data obtained from the AFM.…”
Section: Introductionmentioning
confidence: 99%