2015
DOI: 10.1016/j.optcom.2014.09.017
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Comment on “Nonlinear refraction measurements of materials using the moiré deflectometry”

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Cited by 23 publications
(8 citation statements)
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“…For morphological characterization of the fabricated CNPs by SEM and TEM analyses, NPs colloidal solution was dried on laboratory slides. As shown in Figure 3a-c, Theoretically, at high-intensity fields near the focal point of the converging lens, the sample behaves like a feeble lens whose focal length is proportional to the nonlinear refractive index n 2 of the sample and the position along the Z axis [60]. In the so-called closed-aperture Z-scan, the presence of the far-field aperture enables the setup to analyze the tiny distortions induced by this weak n 2 -dependent lens in the signal beam [61].…”
Section: Resultsmentioning
confidence: 99%
“…For morphological characterization of the fabricated CNPs by SEM and TEM analyses, NPs colloidal solution was dried on laboratory slides. As shown in Figure 3a-c, Theoretically, at high-intensity fields near the focal point of the converging lens, the sample behaves like a feeble lens whose focal length is proportional to the nonlinear refractive index n 2 of the sample and the position along the Z axis [60]. In the so-called closed-aperture Z-scan, the presence of the far-field aperture enables the setup to analyze the tiny distortions induced by this weak n 2 -dependent lens in the signal beam [61].…”
Section: Resultsmentioning
confidence: 99%
“…As the sample is brought closer to the focus, the beam irradiance increases, producing self-lensing in the sample. Self-lensing is a nonlinear optical phenomenon induced in the materials when it is exposed to an intense electromagnetic radiation, where the medium refractive index changes with the electric field intensity and, hence, it acts as a focusing lens [16,17] .A negative self-lensing (self-defocusing) before the focus reduces the diffraction, leading to a small beam at the aperture and a raise of the transmittance. When the sample crosses the focal plane to the right (+ z), the same self-defocusing effect will tend to raise the diffraction and minimize the aperture transmittance, as demonstrated in Figure -4 [20].…”
Section: Z-scan Experimentsmentioning
confidence: 99%
“…For measuring the real part of the nonlinear refractive index, the z-scan setup is used in its closed-aperture form, which is shown in figure 1. In this form, since the nonlinear material reacts like a weak z-dependent lens [20], the far-field aperture makes it possible to detect the small beam distortions in the original beam. Since the focusing power of this weak nonlinear lens depends on the nonlinear refractive index [20], it would be possible to extract its value by analyzing the z-dependent data acquired by the detector and by cautiously interpreting them using an appropriate theory [16].…”
Section: Z-scan Measurementsmentioning
confidence: 99%
“…In this form, since the nonlinear material reacts like a weak z-dependent lens [20], the far-field aperture makes it possible to detect the small beam distortions in the original beam. Since the focusing power of this weak nonlinear lens depends on the nonlinear refractive index [20], it would be possible to extract its value by analyzing the z-dependent data acquired by the detector and by cautiously interpreting them using an appropriate theory [16]. To measure the imaginary part of the nonlinear refractive index or the nonlinear absorption coefficient, the z-scan setup is used in its open-aperture form.…”
Section: Z-scan Measurementsmentioning
confidence: 99%