Common methodological approach to evaluation of radiation resistance of gate arrays and semicustom very large scale ICs based on them

Moskovskaya, Yu.

doi:10.22184/1993-8578.2017.71.1.50.59

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Common methodological approach to evaluation of radiation resistance of gate arrays and semicustom very large scale ICs based on them

Cited by 2 publications

References 9 publications

Nonparametric Statistical Analysis of Radiation Hardness Threshold Variation in CMOS IC Wafer Lots Series with the Aim of Process Monitoring

Nonparametric Statistical Analysis of Radiation Hardness Threshold Variation in CMOS IC Wafer Lots Series with the Aim of Process Monitoring

Эволюция Радиационного Поведения Субмикроэлектронных Устройств При Снижении Проектных Норм И Особенности Развития Инфраструктуры Испытаний И Исследований

Contact Info

Product

Resources

About