Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.
DOI: 10.1109/pvsc.2002.1190879
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Commonly observed degradation in field-aged photovoltaic modules

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Cited by 191 publications
(120 citation statements)
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“…15,16 Nevertheless, in our case, the modules are new and the failure occurred within few years, which seems to indicate a specific and faulty manufacturing process. This series resistance is responsible for the irreversible degradation of the affected PV modules, as the following section shows, as well as a part of the measured power losses.…”
Section: Testing Campaignmentioning
confidence: 54%
“…15,16 Nevertheless, in our case, the modules are new and the failure occurred within few years, which seems to indicate a specific and faulty manufacturing process. This series resistance is responsible for the irreversible degradation of the affected PV modules, as the following section shows, as well as a part of the measured power losses.…”
Section: Testing Campaignmentioning
confidence: 54%
“…Other degradation mechanisms include metal mitigation through the p-n junction and antireflection coating deterioration. All the abovementioned degradation mechanisms have been obtained from previous experience on c-Si technologies (Dunlop, 2005;Quintana et al, 2002;Som & Al-Alawi, 1992). …”
Section: Pv Degradationmentioning
confidence: 99%
“…A number of researchers have undertaken, over the years, to study the long-term outdoor performance, degradation and failure of solar PV modules around the world. Notable authors in this area include Lorenzo et al [36], Bandou et al [37], Ndiaye et al [38], Jordan and Kurtz [18], Quintana et al [39], Skoczek [40], Skoczek et al [41], Kahoul et al [42] and Ferrara and Daniel [43]. The literature identifies major causes and modes of module degradation and failure to include [18,39]: degradation of packaging materials, loss of adhesion, degradation of cell/module interconnects as a result of thermomechanical fatigue, degradation due to moisture intrusion and degradation of semiconductor device [39].…”
Section: Introductionmentioning
confidence: 99%