2024
DOI: 10.1088/1402-4896/ad86f9
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Comparative analysis of machine learning techniques in predicting dielectric behavior of ternary chalcogenide thin films

R A Mohamed,
H E Atyia

Abstract: The current research introduces a comparative analysis of the dielectric behavior exhibited by ternary chalcogenide thin films, including both experimental data and machine learning techniques. The study of temperature and frequency dependencies of dielectric parameters is crucial for assessing material losses, particularly focusing on the low-frequency range where dielectric dispersion occurs. The experimental results on the frequency (100–1000000 Hz)and the temperature(303 –393 K) influences on the dielectri… Show more

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