“…23 Imaging techniques such as scanning electron microscopy 24,25 or even X-ray tomography 7 are useful for assessment of the consequences of chemical expansion, e.g., the damage caused to electrochemical devices. In turn, the more complex, in terms of the experimental setups and the interpretation of the results, and more recently developed methods-transmission electron microscopy, 26 scanning probe microscopy, 27,28 X-ray absorption ne structure (EXAFS), 29 etc.are well-suited for studying thin lms and interfaces. 10 Various original combinations of methods, e.g., Raman spectroscopy coupled with electrochemical titration 30 and time-resolved XRD coupled with potential step chronoamperometry, 31 regularly emerge, allowing previously inaccessible insights into chemical strain to be obtained.…”