Comparative study of CdS thin films deposited by single, continuous, and multiple dip chemical processes

Oladeji, Isaiah O.; Chow, Lee; Liu, J.R; Chu, W. K.; Bustamante, A.N.P.; Fredricksen, Christopher J.; Schulte, Alfons

doi:10.1016/s0040-6090(99)00747-6

Cited by 112 publications

(38 citation statements)

References 19 publications

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“…It can be seen that the diffraction peak is sharp and well defined indicating that the films are single crystalline with peak diffraction at ~26.53˚ having cubic structure with (111) plane orientation according to International Center for Diffraction Data (ICDD) card number 10-0454. This result agrees with the previous observations reported by 17,18 . It is clear from Figure 1 that annealing leads to increase in the peak intensity.…”

Section: X-ray Diffraction Analysissupporting

confidence: 94%

Structural, Optical and Electrical Properties of Thermally Deposited CdS Thin Films

2017

JCBSC

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Thermal evaporation technique is used to deposit CdS thin films on glass substrates using CdS powder. Various characterization techniques have been used to investigate the structural, optical and electrical properties of the prepared thin films. The results of XRD analysis showed that the as-deposited and annealed (at 200 C for 1 hour) CdS films were single crystalline having a cubic structure with (111) plane orientation according to International Center for Diffraction Data (ICDD) card number 10-0454. The crystallite size is found to be 37.32 nm and 39.78 nm for the as-deposited and annealed films respectively. The "AFM" outcomes show uniform, homogeneous and tightly adherent films over the entire glass substrate surface without any voids, pinholes or cracks and having a large number of grains. The UV-Visible-NIR absorbance spectra were recorded in the range of (400-1100) nm to investigate the optical characteristics. The results have shown that the CdS films have a low absorbance in the visible-near infrared region from ~ 500 nm to 1100 nm. The energy gap was calculated using Tauc's plot and it was around 2.4 eV for the asdeposited and annealed films. The electrical characterization included D.C. conductivity and Hall Effect measurements were carried out. From D.C. measurements, it was found that the deposited films have two transport mechanisms of free carriers and two activation energies were estimated. Hall measurement results showed that the deposited films are n-type, and the carrier concentration and mobility have been estimated.

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Section: X-ray Diffraction Analysissupporting

confidence: 94%

Structural, Optical and Electrical Properties of Thermally Deposited CdS Thin Films

2017

JCBSC

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“…This suggest that the obtained films are crystallized in the hexagonal structure with a preferred orientation along the (002) direction. However, R. Zhai et al [13], O. Oladeji et al [14] and M. Ichimura et al [15], using chemical bath deposition and other techniques, have been found a cubic structure of the CdS films. In fact, depending on the preparation method, cadmium sulphide can exist in both sphalerite cubic and hexagonal forms, but the latter structure is more stable [6].…”

Section: Methodsmentioning

confidence: 98%

Influence of Bath Temperature, Deposition Time and S/Cd Ratio on the Structure, Surface Morphology, Chemical Composition and Optical Properties of CdS Thin Films Elaborated by Chemical Bath Deposition

Ouachtari¹,

Rmili²,

Elidrissi³

et al. 2011

JMP

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Cadmium sulphide (CdS) thin films were deposited on glass substrates by the chemical bath deposition (CBD) method, using anhydrous cadmium chloride (CdCl 2 ) and thiourea (CS(NH 2 ) 2 ) as sources of cadmium and sulphur ions respectively. The influence of bath temperature (T b ), deposition time (t d ) and [S]/[Cd] ratio in the solution on the structural, morphological, chemical composition and optical properties of these films were investigated. XRD studies revealed that all the deposited films were polycrystalline with hexagonal structure and exhibited (002) preferential orientation. The films deposited under optimum conditions (T b = 75˚C, t d = 60 min and [S]/[Cd] ratio = 2.5) were relatively well crystallized. These films showed large final thickness and their surface morphologies were composed of small grains with an approximate size of 20 to 30 nm and grains grouped together to form large clusters. EDAX analysis revealed that these films were nonstoichiometric with a slight sulphur deficiency. These films exhibited also a transmittance value about 80% in the visible and infra red range.

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“…10-0454. The intense diffraction peak appearing approximately at 2θ = 26.6° corresponds to the (111) plane of the cubic CdS (Senthamilselvi et al, 2013;Oladeji et al, 2000;Cortes et al, 2004). The lattice constant (a) of the cubic structure of CdS films is calculated using the following formula:…”

Section: Xrd Analysismentioning

confidence: 99%

Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine

Manikandan¹,

Dilip²,

Prabaharan³

et al. 2015

American Journal of Engineering and Applied Sciences

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Abstract:The equimolar concentration thin films of Cadmium Sulfide (Cd x S x ) with the complexing agent TEA were deposited on a glass substrate by the SILAR technique. The crystalline nature with face centered cubic crystal system of the CdS films is determined from Xray diffraction analysis. The broadened diffraction peaks indicated nano sized particles of the film materials. The surface morphology of the films was studied by SEM analysis. The Energy Dispersive Analysis of X-ray (EDAX) plot confirms the equimolar composition of Cd and S ions in the film materials. Surface topography of the film was studied by AFM. The optical characteristic of absorbance, transmittance and band gap was analyzed by UV-visible spectra. The band gap energy of the material was observed as 2.18 eV and chemical bonding was studied by FT-IR spectral analysis.

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Comparative study of CdS thin films deposited by single, continuous, and multiple dip chemical processes

Cited by 112 publications

References 19 publications

Structural, Optical and Electrical Properties of Thermally Deposited CdS Thin Films

Structural, Optical and Electrical Properties of Thermally Deposited CdS Thin Films

Influence of Bath Temperature, Deposition Time and S/Cd Ratio on the Structure, Surface Morphology, Chemical Composition and Optical Properties of CdS Thin Films Elaborated by Chemical Bath Deposition

Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine

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