2020
DOI: 10.1016/j.radphyschem.2019.108595
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Comparative study of GaN betavoltaic battery based on p-n junction and Schottky barrier diode

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Cited by 12 publications
(4 citation statements)
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“…The energy spectrum of the 63 Ni source exhibited a wide range to a 66 keV peak energy [ 19 ]. We additionally confirmed the performances of the optimized diode depending on the injected electron energy.…”
Section: Resultsmentioning
confidence: 99%
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“…The energy spectrum of the 63 Ni source exhibited a wide range to a 66 keV peak energy [ 19 ]. We additionally confirmed the performances of the optimized diode depending on the injected electron energy.…”
Section: Resultsmentioning
confidence: 99%
“…These results revealed that the variations of the current of the irradiated diodes depending on the energy of the e-beam were large. The probability of beta particles generated from the 63 Ni source showed a high distribution below 20 keV [ 19 ]. Also, the depletion width formed in the i-GaN region was small at about 600 nm (in case of D i-GaN = 1 × 10 16 cm −3 ), and the diffusion length of GaN can be shortened by native defects.…”
Section: Resultsmentioning
confidence: 99%
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“…1,2) In recent years, wide bandgap semiconductors have been widely used as the energy converting material of betavoltaic batteries. [3][4][5] Compared with betavoltaic batteries based on Si 6) or GaAs, 7) they have a higher open-circuit voltage, conversion efficiency and radiation damage resistance. 8) Specifically, SiC (silicon carbide) is a wide bandgap semiconductor with high thermal capability, high carrier mobility, high breakdown field strength and excellent radiation resistance.…”
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confidence: 99%