2008
DOI: 10.1088/1742-6596/112/4/042059
|View full text |Cite
|
Sign up to set email alerts
|

Comparative study on EUV and debris emission from CO2and Nd: YAG laser-produced tin plasmas

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2010
2010
2011
2011

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(3 citation statements)
references
References 4 publications
0
3
0
Order By: Relevance
“…1 Sn is considered as the source for EUV plasma due to its high conversion efficiency ͑CE͒ from laser to 13.5 nm ͑3% bandwidth͒ EUV emission. In this regard, most of the previous studies of Sn LPP have focused to increase the CE of the EUV light source and decrease the debris using different laser wavelength, [6][7][8][9] different pulse duration, and samples with different thickness and different percentage of Sn, 10 etc. The debris limit the lifetime of the expensive and delicate Mo/Si multilayer collector.…”
Section: Introductionmentioning
confidence: 99%
“…1 Sn is considered as the source for EUV plasma due to its high conversion efficiency ͑CE͒ from laser to 13.5 nm ͑3% bandwidth͒ EUV emission. In this regard, most of the previous studies of Sn LPP have focused to increase the CE of the EUV light source and decrease the debris using different laser wavelength, [6][7][8][9] different pulse duration, and samples with different thickness and different percentage of Sn, 10 etc. The debris limit the lifetime of the expensive and delicate Mo/Si multilayer collector.…”
Section: Introductionmentioning
confidence: 99%
“…For example, while debris production is more pronounced for Nd:YAG lasers, CO 2 laser beams produce more energetic ions at the optimum conditions for laser energy intensities needed for maximum EUV production. 1,2 Additionally the impact of plasma fast ions and the deposition of atomic debris and the deposition of EUV and out of band radiation can further cause surface erosion and damage at the required higher 1932-5150/2011/$25.00 C 2011 SPIE fluences of the 13.5 nm radiation needed for high volume manufacturing. 3 The lower mass ablation rate by the CO 2 laser beams with the longer wavelength and comparatively low value of the critical density for absorption of these photons allow source operation using longer pulses (100 ns and more) without significant reduction in the efficiency of EUV output.…”
Section: Introductionmentioning
confidence: 99%
“…Damage of multilayer Mo/Si mirrors by the debris products of laser beam interaction with target materials can significantly reduce their lifetime and as result the efficiency and the economy of the entire EUVL system. For example, while debris production is more pronounced for Nd:YAG lasers, CO 2 laser beams produce more energetic ions at the optimum conditions for laser energy intensities needed for maximum EUV production [1], [2]. Additionally the impact of plasma fast ions and the deposition of atomic debris and the deposition of EUV and out of band radiation can further cause surface erosion and damage at the required higher fluences of the 13.5 nm radiation needed for high volume manufacturing [3].…”
Section: Introductionmentioning
confidence: 99%