Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Abelmann, Léon; Porthun, S.; Haast, M.A.M.; Lodder, Cock; Möser, Andreas; Best, M.E.; Schendel, P. J. A. van; Stiefel, B.; Hug, Hans J.; Heydon, G.P.; Farley, A. N.; Hoon, Steve R.; Pfaffelhuber, T.; Proksch, Roger; Babcock, K. L.

doi:10.1016/s0304-8853(98)00281-9

Cited by 53 publications

(25 citation statements)

References 13 publications

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“…The MFM signal for a sample with a periodic 0018-9464/03$17.00 © 2003 IEEE magnetic surface charge density is calculated by using the following [5], [6]: (1) The calculations were carried out for tips with three different tip-end shapes: flat, triangular, and ellipsoidal. From calculations with changing , the MFM transfer function is then obtained using the following values (identical to those in [7]):…”

Section: Methodsmentioning

confidence: 99%

High-resolution MFM: Simulation of tip sharpening

et al. 2003

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Abstract-The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was estimated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan 45 . The sensitivity shows a maximum around an ellipticity of tan 80 . The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip.

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Section: Methodsmentioning

confidence: 99%

High-resolution MFM: Simulation of tip sharpening

et al. 2003

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“…Therefore we usually find a considerably lower signal than predicted by the bar tip model. For the CAMST reference sample for instance [1], we typically find signals in the order of 1-3 Hz, whereas the bar tip model predicts 10-100 Hz.…”

Section: Beware!mentioning

confidence: 99%

“…And finally, recording media are very resistant to the influence of external fields, so tip/sample interaction is not really a problem. It is therefore not coincidental that reference samples for MFM originate from the magnetic recording community (such as the NIST hard disk [23] or the Magneto-optic disk used for the CAMST reference sample [1]). …”

Section: Mfm In Magnetic Data Storage Researchmentioning

confidence: 99%

“…In the first place the cantilever end is deflected towards or away from the sample surface by a distance ∆z: 1 This chapter is accompanied by a webpage http://www.el.utwente.nl/smi/mfmchapter/, where you can find errata and links for further reading [3]. When applying an oscillating force F z = F 0 cos(ωt) on the end of the cantilever, the resulting displacement is harmonic as well, but has a phase shift for ω > 0, z = z 0 cos(ωt + θ(ω)).…”

Section: Mode Of Operationmentioning

confidence: 99%

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Magnetic Force Microscopy — Towards Higher Resolution

Abelmann¹,

Bos²,

Lodder³

2005

Magnetic Microscopy of Nanostructures

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Abstract. In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution and the design and realisation of MFM tips. Principle of MFMThe technique of Magnetic Force Microscopy has been discussed extensively in literature [8,20,12], so we will restrict ourselves to a short description. The principle of Magnetic Force Microscopy is very much alike that of Atomic Force Microscopy -some even dare to mention that MFM is just an AFM with a magnetic tip, much to the dislike of MFM developers because in an MFM much smaller forces are measured. In essence it is true however, and every MFM is capable of AFM as well (the other way round is not true in general).In an MFM the magnetic stray field above a very flat specimen, or sample, is detected by placing a small magnetic element, the tip, mounted on cantilever spring very close to the surface of the sample (figure 1). Typical dimensions are a cantilever length of 200 µm , tip length of 4 µm and diameter of 50 nm and a distance from the surface of 30 nm. The force on the magnetic tip is detected by measuring the displacement of the end of the cantilever, usually by optical means. The forces measured in typical MFM applications are in the order of 30 pN, with typical cantilever deflections in the order of nanometers.An image of the magnetic stray field is obtained by slowly scanning the cantilever over the sample surface, in a raster-like fashion. Typical scan area's are from 1 up to 200 µm with imaging times in the order of 5-30 minutes.

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“…Scanning probe magnetic force microscopy (MFM) [2,3] is the state-of-the-art tool used to explore submicron magnetic domain structures and written bit patterns in recording media [4,5], for imaging of currents in internal conductors [6], etc. MFM is popular for its high spatial resolution (∼ 50 nm), high sensitivity in large variety of environmental conditions, and for simple sample preparation.…”

Section: Introductionmentioning

confidence: 99%

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

Cambel¹,

Gregušová²,

Eliáš³

et al. 2011

Journal of Electrical Engineering

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In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure -Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.

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Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Cited by 53 publications

References 13 publications

High-resolution MFM: Simulation of tip sharpening

High-resolution MFM: Simulation of tip sharpening

Magnetic Force Microscopy — Towards Higher Resolution

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

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