2021 2nd International Conference on Communication, Computing and Industry 4.0 (C2I4) 2021
DOI: 10.1109/c2i454156.2021.9689428
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Comparison of Efficiency and Failure Rate of SEPIC, Cuk and Zeta Converter for Application to Stand Alone PV System

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Cited by 3 publications
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“…To compute the MTBF, failure rate equations and stress factors assumed for individual components are referred from MILHDBK [23] as in Table 1. To obtain the stress factor due to temperature, for the MOSFET,…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…To compute the MTBF, failure rate equations and stress factors assumed for individual components are referred from MILHDBK [23] as in Table 1. To obtain the stress factor due to temperature, for the MOSFET,…”
Section: Methodsmentioning
confidence: 99%
“…where, π‘‡π‘Ž is ambient temperature: 30⁰C; πœƒπ‘—π‘Ž is ambient and junction thermal resistance of the device: 1⁰C/w; πœƒπ‘—π‘ is junction and case thermal resistance: 0.95 (for switch): 1.6 (for diode), (from data sheets); π‘ƒπ‘™π‘œπ‘ π‘  is power loss of semiconductor device. Data sheet specifications of IRFP150N MOSFET is considered for computation of power loss [23]- [25].…”
Section: Methodsmentioning
confidence: 99%