Comparison of electronics-reliability assessment approaches

Cushing, Michael J.; Mortin, D.E.; Stadterman, Thomas; Malhotra, Ananya

doi:10.1109/24.273574

Cited by 103 publications

(35 citation statements)

References 5 publications

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“…However, due to the complexity of the interactions among the SEM components and the lack of the related failure data, the results obtained by these methods may not be representative of the realistic conditions [22].…”

Section: Introductionmentioning

confidence: 99%

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

Yang

Chen

et al. 2014

International Journal of Electrical Power & Energy Systems

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Section: Introductionmentioning

confidence: 99%

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

Yang

Chen

et al. 2014

International Journal of Electrical Power & Energy Systems

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“…Hence, they offer limited insight with serious faults into practical reliability issues. A number of approaches reported in the literature [26][27][28] have been used for products reliability assessment such as prognosis and health management of power devices (PHM) [9,29]. Such methods can be considered as a practical alternative way of looking at product reliability and life cycles conditions where the remaining useful life of the product can be predicted by assessing the extent of degradation from the product's original state of health and its expected usage conditions [30][31][32].…”

Section: Mission Profile Based Reliability Design Andmentioning

confidence: 99%

Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics

Musallam

Yin

Bailey

et al. 2015

IEEE Trans. Power Electron.

144

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A note on versions:The version presented here may differ from the published version or from the version of record. If you wish to cite this item you are advised to consult the publisher's version. Please see the repository url above for details on accessing the published version and note that access may require a subscription.For more information, please contact eprints@nottingham.ac.ukManuscript ID TPEL-Reg-2014-04-0475.R2 1  Abstract-Power electronics are efficient for conversion and conditioning of the electrical energy through a wide range of applications. Proper life consumption estimation methods applied for power electronics that can operate in real-time under inservice mission profile conditions will not only provide an effective assessment of the products life expectancy but also they can deliver reliability design information. This is important to aid in manufacturing and thus help in reducing costs and maximizing through-life availability. In this paper, a mission profile based approach for real-time life consumption estimation which can be used for reliability design of power electronics is presented. The paper presents the use of electro-thermal models coupled with physics-of-failure analysis by means of real-time counting algorithm to provide accurate life consumption estimations for power modules operating under in-service conditions. These models, when driven by the actual mission profiles, can be utilized to provide advanced warning of failures and thus deliver information that can be useful to meet particular application requirements for reliability at the design stage. To implement this approach, an example of two case studies using mission profiles of a metro-system and wind-turbines applications are presented.

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“…Handbook methods are relatively simple to implement, in that they do not require complex mathematical modelling, only part types, part counts, application environments and other readily available parameters, these parameters are then input into a model to calculate the MTBF. Despite its advantages Mil-Hdbk-217 is increasingly falling out of favour [12,17,42,50,51], a non-exhaustive list of the limitations are:…”

Section: Handbook Methodsmentioning

confidence: 99%

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

Amy

Aglietti

Richardson

2009

Shock and Vibration

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Abstract. Increasingly modern electronic equipment is expected to provide more functionality whilst still being able to withstand shock and vibration loads. The process of reliability prediction has been hampered by the complicated response and failure characteristics of electronic equipment, with the currently available methods being a compromise between accuracy and cost. A process to quickly and confidently predict the reliability of proposed electronic equipment to dynamic loads would greatly benefit industry. This paper will illustrate the difficulties in predicting electronic equipment reliability, showing why progress has been slow, in addition to the difficulty in making a model that works across a broad range of equipment configurations. The four classes of reliability prediction methods (Handbook, Test data, Field data and Physics of Failure) will be contrasted before addressing the individual methods.It is pertinent to note that although the majority of failures in electronic equipment are due to thermal issues, this review focuses on shock and vibration induced failures.

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Comparison of electronics-reliability assessment approaches

Cited by 103 publications

References 5 publications

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

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