2005
DOI: 10.1002/pssc.200461482
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Comparison of GaMnN epilayers prepared by ion implantation and metalorganic chemical vapor deposition

Abstract: The ferromagnetic semiconductor GaMnN has been produced by two methods – ion implantation and metalorganic chemical vapor deposition (MOCVD). P‐type, n‐type, and intrinsic GaN layers grown by MOCVD were ion‐implanted with 3 × 1016/cm2 Mn+ at 200 keV and subsequently annealed under various conditions. Considerable lattice damage is observed by analyzing the peak asymmetry in X‐ray diffraction; annealing only partially recovers this damage. Second phases (MnxNy, GaxMny and Mn4–xGaxN1–y) have been detected upon s… Show more

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Cited by 13 publications
(22 citation statements)
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“…This second phase is not observed in the samples capped with a thin GaN layer, even at annealing temperatures of 900 o C, though further investigations are required to determine the post-annealing phase purity of the capped samples. The Mn 6 N 2.58 and Mn 3 N 2 phases were not observed via XRD in the annealed MOCVD-grown samples as had been previously reported in implanted samples [13].…”
Section: Resultssupporting
confidence: 75%
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“…This second phase is not observed in the samples capped with a thin GaN layer, even at annealing temperatures of 900 o C, though further investigations are required to determine the post-annealing phase purity of the capped samples. The Mn 6 N 2.58 and Mn 3 N 2 phases were not observed via XRD in the annealed MOCVD-grown samples as had been previously reported in implanted samples [13].…”
Section: Resultssupporting
confidence: 75%
“…As many of the initial results for Ga 1-x Mn x N were of implanted material [9,10], there would always be some post processing required when using this technique. Excessive annealing was also found to produce second phases in as-grown and implanted material, though the exact phase produced varied from Mn 3 N 2 and Mn 6 N 2.58 [11] to GaMn intermetallics [12] to Mn 3 GaN [13,14] depending on the processing conditions. Ultimately, the optimal growth and processing path for room temperature ferromagnetic GaMnN must be understood.…”
Section: Introductionmentioning
confidence: 99%
“…This second phase is not observed in the samples capped with a thin GaN layer, even at annealing temperatures of 900 o C, though further investigations are required to determine the post-annealing phase purity of the capped samples. The Mn 6 N 2.58 and Mn 3 N 2 phases were not observed via XRD in the annealed MOCVD grown samples as has been previously reported in implanted samples [16].…”
Section: High Resolution X-ray Diffractionsupporting
confidence: 59%
“…As many of the initial results for Ga 1-x Mn x N were of implanted material, there would always be some post processing required from this technique. Excessive annealing was also found to produce second phases in as-grown and implanted material, though the exact phase produced varied from Mn 3 N 2 and Mn 6 N 2.58 [34] to GaMn intermetallics [35] to Mn 3 GaN [16,24] depending on the processing conditions. Ultimately, the optimal growth and processing path for room temperature ferromagnetic Ga 1-x Mn x N must be understood for future applications.…”
Section: Obstacles To Ferromagnetic Applications Of Gamnnmentioning
confidence: 93%
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