1999
DOI: 10.1016/s0965-9773(99)00410-9
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Comparison of grain size distributions obtained by XRD and TEM in milled FCC powders

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Cited by 17 publications
(8 citation statements)
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“…For this reason the grain size cannot be calculated simply by using the Scherrer equation; instead a more elaborated method considering the combined effects of grain size and microstrain has to be employed, as pointed out by Cullity and Stock [25]. Among the methods more currently used are the Williamson-Hall and Warren-Averbach methods [26][27][28][29][30]. The latter was selected this paper.…”
Section: Effect Of the Ball-to-powder Ratio (Bpr)mentioning
confidence: 99%
“…For this reason the grain size cannot be calculated simply by using the Scherrer equation; instead a more elaborated method considering the combined effects of grain size and microstrain has to be employed, as pointed out by Cullity and Stock [25]. Among the methods more currently used are the Williamson-Hall and Warren-Averbach methods [26][27][28][29][30]. The latter was selected this paper.…”
Section: Effect Of the Ball-to-powder Ratio (Bpr)mentioning
confidence: 99%
“…For this purpose, determination of grain size is of great importance. Transmission electron microscopy (TEM) investigation, that is based on direct observations and counting of the grains [11], provides grain size and grain size distribution, which is closer to the reality. However, due to the ease of X-ray diffraction technique, this method has been used extensively to determine the size of the coherent domains in nanomaterials.…”
Section: Introductionmentioning
confidence: 99%
“…The most problematic issue is the determination of grain size and grain size distribution [4,5]. Size and strain analysis based on X-ray diffraction (XRD) is the most common method for the evaluation of the coherently scattering domain size in nanocrystalline materials [4][5][6][7][8]. The method is an indirect approach and is based on the broadening of the X-ray reflections [8,9].…”
Section: Introductionmentioning
confidence: 99%
“…The method is an indirect approach and is based on the broadening of the X-ray reflections [8,9]. On the other hand, grain size determination by TEM is based on the direct observation of the microstructure [4]. As a result, a rather large discrepancy is generally observed between the grain size observed by XRD and TEM [5].…”
Section: Introductionmentioning
confidence: 99%