Here we show what determines the optical resolution in laser microscopy. We define the expanded resolution limit (spatial frequency cutoff) that includes the classic Abbe definition as 2 NA/λ, where λ is the wavelength. The resolution limit can approximately be redefined as the frequency cutoff αNA/λ, where α is the constant that depends on the optical process occurring in the sample. In the case of the optical process originating from the linear susceptibility χ (1) , the resolution limit is well known as the Abbe definition, namely, α = 2. However, when other optical processes are harnessed to form the image through laser microscopy, the resolution limit can differ. We formulate a theoretical framework that can calculate the expanded resolution limits of all kinds of laser microscopy utilizing coherent, incoherent, linear, and nonlinear optical processes.