2018
DOI: 10.1063/1.5004098
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Comparison of methods applied in photoinduced transient spectroscopy to determining the defect center parameters: The correlation procedure and the signal analysis based on inverse Laplace transformation

Abstract: The procedure for determination of trap parameters by photo-induced transient spectroscopy is based on the Arrhenius plot that illustrates a thermal dependence of the emission rate. In this paper, we show that the Arrhenius plot obtained by the correlation method is shifted toward lower temperatures as compared to the one obtained with the inverse Laplace transformation. This shift is caused by the model adequacy error of the correlation method and introduces errors to a calculation procedure of defect center … Show more

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Cited by 8 publications
(5 citation statements)
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“…where L{du/dx} and L{di/dx} are the Laplace transforms of the partial derivative over time for voltage and current, respectively; I(x, s) and U(x, s) are the Laplace transforms on the long line of current and voltage, respectively; and s is the Laplace transform operator. The voltage and current equation transforms take the form [23][24][25] U…”
Section: Modelling the Heating Up Of Electrical Cablesmentioning
confidence: 99%
“…where L{du/dx} and L{di/dx} are the Laplace transforms of the partial derivative over time for voltage and current, respectively; I(x, s) and U(x, s) are the Laplace transforms on the long line of current and voltage, respectively; and s is the Laplace transform operator. The voltage and current equation transforms take the form [23][24][25] U…”
Section: Modelling the Heating Up Of Electrical Cablesmentioning
confidence: 99%
“…The coefficient b is related to the parameters of the defect center. The methods of obtaining and analyzing defect centers parameters based on Arrhenius plot, were the subject of earlier studies presented in detail in [12,13].…”
Section: Determination Of Time Constantsmentioning
confidence: 99%
“…One of the methods of studying the defect structure of semiconductor materials is high-resolution photoinduced transient spectroscopy (HRPITS). Unfortunately, due to the solution of ill-posed equations, the results of the parameters of defect centers obtained on the basis of this method are imprecise [9,10].…”
Section: Introductionmentioning
confidence: 99%