2015
DOI: 10.4209/aaqr.2015.03.0141
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Comparison of Nanoparticle Exposure Levels Based on Facility Type—Small-Scale Laboratories, Large-Scale Manufacturing Workplaces, and Unintended Nanoparticle-Emitting Workplaces

Abstract: The aims of this study were to investigate the concentrations and characteristics of nanoparticle exposure at various workplaces. We compared the concentration and characteristics of nanoparticles at nine workplaces of three types; i.e., small laboratories (LAB), large-scale engineered nanoparticle manufacturing workplaces (ENP), and unintended nanoparticle-emitting workplaces (UNP), using real-time monitoring devices including scanning mobility particle sizers (SMPS), condensation particle counters (CPC), sur… Show more

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Cited by 10 publications
(6 citation statements)
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“…2C), which may result in errors. An SEM image could be useful to find the characteristics of nanoparticles at workplaces [4], [20].…”
Section: Discussionmentioning
confidence: 99%
“…2C), which may result in errors. An SEM image could be useful to find the characteristics of nanoparticles at workplaces [4], [20].…”
Section: Discussionmentioning
confidence: 99%
“…(10)(11)(12) This work has undoubtedly helped to improve the occupational safety in nanotechnology industries. (13) However, the INPs generated in many occupations are not fully understood. Welding is one of the processes that generate high levels of INPs that are known to contain mostly iron (Fe) and manganese (Mn) oxides, among many other metals.…”
Section: Introductionmentioning
confidence: 99%
“…Weighing was performed using a high-speed microbalance with a readability of 1 µg (XP6; Mettler Toledo, Columbus, OH, USA). For SEM analysis, the open-face sampling technique was used (Ham et al, 2015). The PC filter for SEM analysis was cut randomly because it was assumed that particles were evenly distributed on the filter.…”
Section: Air Samplingmentioning
confidence: 99%